Contact and non-contact mode imaging by atomic force microscopy

• Published in: Thin solid films Vol. 273; no. 1; pp. 138 - 142
• Main Authors: Morita, Seizo, Fujisawa, Satoru, Kishi, Eigo, Ohta, Masahiro, Ueyama, Hitoshi, Sugawara, Yasuhiro
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Lausanne Elsevier B.V 01.02.1996; Elsevier Science
• Subjects: Atomic force microscopy; Condensed matter: structure, mechanical and thermal properties; Exact sciences and technology; Physics; Solid surfaces and solid-solid interfaces; Surface structure and topography; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Atomic force microscopy; Image forming; Indium phosphides; Topography; Surfaces; Cleavage; Crystal faces; Surface analysis; Experimental study; Interferometers
• ISSN: 0040-6090; 1879-2731
• DOI: 10.1016/0040-6090(95)06806-6

An atomic force microscope (AFM) with an optical interferometer method works as an atomic-scale corrugation microscope, while an atomic force/lateral force microscope (AFM/LFM) with an optical lever deflection method works as a two-dimensional frictional force microscope (2D-FFM) with an atomic resolution. Using an ultrahigh-vacuum AFM with an optical interferometer method, we demonstrated true atomic resolution imaging of the cleaved InP(110) surface in non-contact mode. Then, using a 2D-FFM in air, we studied the two-dimensional nature of friction by measuring the atomic-scale friction of a Si 3N 4 tip in contact with cleaved sample surfaces such as MoS 2, graphite and NaF(100). As a result, we confirmed the existence of the two-dimensionally discrete friction with a lattice periodicity. Besides, using a two-dimensional stick-slip model, we managed to explain the tip trajectory quantitatively induced by the two-dimensionally discrete friction with a lattice periodicity.