Evaluation of a new plasma source for molecular beam epitaxial growth of InN and GaN films

An RF plasma source has been integrated into a molecular beam epitaxial system for growth of nitride films. Using an optical detector on the source, the presence of nitrogen atoms in the N 2 plasma region is deduced as a function of operating conditions. The plasma source has been used to grow hexag...

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Published inJournal of crystal growth Vol. 111; no. 1; pp. 1024 - 1028
Main Authors Hoke, W.E., Lemonias, P.J., Weir, D.G.
Format Journal Article Conference Proceeding
LanguageEnglish
Published Amsterdam Elsevier B.V 01.05.1991
Elsevier
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Abstract An RF plasma source has been integrated into a molecular beam epitaxial system for growth of nitride films. Using an optical detector on the source, the presence of nitrogen atoms in the N 2 plasma region is deduced as a function of operating conditions. The plasma source has been used to grow hexagonal wurtzite films of InN and GaN. The film-substrate interface is more abrupt for GaN than InN films. For site competition the active nitrogen species from the plasma is found to incorporate more readily than As 2.
AbstractList An RF plasma source has been integrated into a molecular beam epitaxial system for growth of nitride films. Using an optical detector on the source, the presence of nitrogen atoms in the N 2 plasma region is deduced as a function of operating conditions. The plasma source has been used to grow hexagonal wurtzite films of InN and GaN. The film-substrate interface is more abrupt for GaN than InN films. For site competition the active nitrogen species from the plasma is found to incorporate more readily than As 2.
Author Lemonias, P.J.
Hoke, W.E.
Weir, D.G.
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Issue 1
Keywords Crystal growth
Plasma
Gallium Nitrides
Indium Nitrides
Molecular beam condensation
Epitaxy
Wurtzite structure
Instrumentation
Experimental study
Inorganic compound
Thin film
Language English
License CC BY 4.0
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MeetingName Molecular beam epitaxy 1990 : [selected papers], La Jolla, CA, USA, 27-31 August 1990
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Snippet An RF plasma source has been integrated into a molecular beam epitaxial system for growth of nitride films. Using an optical detector on the source, the...
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SubjectTerms Cross-disciplinary physics: materials science; rheology
Exact sciences and technology
Materials science
Methods of deposition of films and coatings; film growth and epitaxy
Physics
Vacuum deposition
Title Evaluation of a new plasma source for molecular beam epitaxial growth of InN and GaN films
URI https://dx.doi.org/10.1016/0022-0248(91)91125-T
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