1 MHz quartz length extension resonator as a probe for scanning near-field acoustic microscopy

The feasibility of a rod-shaped 1 MHz length extension quartz resonator as a probe for scanning near-field acoustic microscopy was investigated. A corner of the quartz rod which is exposed at an angle of 45 ° to the surface of the sample is used as a probing tip. The damping of the vibration increas...

Full description

Saved in:
Bibliographic Details
Published inThin solid films Vol. 264; no. 2; pp. 172 - 175
Main Authors Michels, A., Meinen, F., Murdfield, T., Göhde, W., Fischer, U.C., Beckmann, E., Fuchs, H.
Format Journal Article Conference Proceeding
LanguageEnglish
Published Lausanne Elsevier B.V 15.08.1995
Elsevier Science
Subjects
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Quartz resonator
Scanning near-field acoustic microscopy
Solid surfaces and solid-solid interfaces
Surface structure and topography
Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)
Scanning near-field acoustic microscopy
Quartz resonator
Piezoelectric device
Acoustic microscopy
Morphology
Topography
Surface analysis
Experimental study
Resonators
Probes
Online AccessGet full text

Cover

Abstract The feasibility of a rod-shaped 1 MHz length extension quartz resonator as a probe for scanning near-field acoustic microscopy was investigated. A corner of the quartz rod which is exposed at an angle of 45 ° to the surface of the sample is used as a probing tip. The damping of the vibration increases with the approach of the tip to the sample and is used as a signal to obtain a topographic image of the sample at sub-micron resolution.
AbstractList The feasibility of a rod-shaped 1 MHz length extension quartz resonator as a probe for scanning near-field acoustic microscopy was investigated. A corner of the quartz rod which is exposed at an angle of 45 ° to the surface of the sample is used as a probing tip. The damping of the vibration increases with the approach of the tip to the sample and is used as a signal to obtain a topographic image of the sample at sub-micron resolution.
Author Beckmann, E.
Fuchs, H.
Fischer, U.C.
Michels, A.
Meinen, F.
Murdfield, T.
Göhde, W.
Author_xml – sequence: 1
  givenname: A.
  surname: Michels
  fullname: Michels, A.
  organization: Fachhochschule Lippe, Liebigstr. 87, D-32657 Lemgo, Germany
– sequence: 2
  givenname: F.
  surname: Meinen
  fullname: Meinen, F.
  organization: Fachhochschule Lippe, Liebigstr. 87, D-32657 Lemgo, Germany
– sequence: 3
  givenname: T.
  surname: Murdfield
  fullname: Murdfield, T.
  organization: Westfälische-Wilhelms-Universität Münster, Wilhelm-Klemm-Str. 10, D-48149 Münster, Germany
– sequence: 4
  givenname: W.
  surname: Göhde
  fullname: Göhde, W.
  organization: Westfälische-Wilhelms-Universität Münster, Wilhelm-Klemm-Str. 10, D-48149 Münster, Germany
– sequence: 5
  givenname: U.C.
  surname: Fischer
  fullname: Fischer, U.C.
  organization: Westfälische-Wilhelms-Universität Münster, Wilhelm-Klemm-Str. 10, D-48149 Münster, Germany
– sequence: 6
  givenname: E.
  surname: Beckmann
  fullname: Beckmann, E.
  organization: Fachhochschule Lippe, Liebigstr. 87, D-32657 Lemgo, Germany
– sequence: 7
  givenname: H.
  surname: Fuchs
  fullname: Fuchs, H.
  organization: Westfälische-Wilhelms-Universität Münster, Wilhelm-Klemm-Str. 10, D-48149 Münster, Germany
BackLink http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=3675400$$DView record in Pascal Francis
BookMark eNp9kDFPwzAQhS1UJNrCP2DwwABD4BzbSb0goQooUhELrFiOcylGrV3sFNH-ehKKGJlOp3vvnt43IgMfPBJyyuCSASuuAARkBSg4V_IC5ETyLD8gQzYpVZaXnA3I8E9yREYpvQMAy3M-JK-MPs529GNjYrujS_SL9o3iV4s-ueBpxBS8aUOkJlFD1zFUSJtuTdZ47_yCejQxaxwua2ps2KTWWbpyNoZkw3p7TA4bs0x48jvH5OXu9nk6y-ZP9w_Tm3lmuVJtJiaGK8lsNal4JURuCyHqnNegsJKqrIsmr1DIQqiiu7BaGA6KKyYLKGvFGj4mYv-3D04RG72ObmXiVjPQPSPdA9A9AK2k_mGk8852tretTVdo2UTjrUt_Xl6UUgB0suu9DLsKnw6jTtaht1i7iLbVdXD_53wDY6F73g
CODEN THSFAP
CitedBy_id crossref_primary_10_1109_JLT_2016_2614542
crossref_primary_10_1002_ange_200280013
crossref_primary_10_1063_1_1623012
crossref_primary_10_1063_1_2061850
crossref_primary_10_1143_JJAP_45_1996
crossref_primary_10_1016_S0169_4332_99_00547_4
crossref_primary_10_1063_1_2238467
Cites_doi 10.1016/S0007-8506(07)62259-8
10.1007/BF00694423
10.1121/1.1909034
ContentType Journal Article
Conference Proceeding
Copyright 1995
1995 INIST-CNRS
Copyright_xml – notice: 1995
– notice: 1995 INIST-CNRS
DBID IQODW
AAYXX
CITATION
DOI 10.1016/0040-6090(95)05853-2
DatabaseName Pascal-Francis
CrossRef
DatabaseTitle CrossRef
DatabaseTitleList
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Physics
EISSN 1879-2731
EndPage 175
ExternalDocumentID 10_1016_0040_6090_95_05853_2
3675400
0040609095058532
GroupedDBID --K
--M
-~X
.DC
.~1
0R~
123
1B1
1RT
1~.
1~5
29Q
4.4
457
4G.
5VS
6TJ
7-5
71M
8P~
9JN
AABNK
AABXZ
AACTN
AAEDT
AAEDW
AAEPC
AAIAV
AAIKJ
AAKOC
AALRI
AAOAW
AAQFI
AAQXK
AAXUO
AAYJJ
ABFNM
ABFRF
ABJNI
ABMAC
ABNEU
ABXDB
ABXRA
ABYKQ
ACBEA
ACDAQ
ACFVG
ACGFO
ACGFS
ACNNM
ACRLP
ADBBV
ADEZE
ADMUD
AEBSH
AEFWE
AEKER
AENEX
AEZYN
AFFNX
AFKWA
AFRZQ
AFTJW
AGHFR
AGUBO
AGYEJ
AHHHB
AIEXJ
AIKHN
AITUG
AIVDX
AJBFU
AJOXV
ALMA_UNASSIGNED_HOLDINGS
AMFUW
AMRAJ
ASPBG
AVWKF
AXJTR
AZFZN
BBWZM
BKOJK
BLXMC
CS3
DU5
EBS
EFJIC
EFLBG
EJD
EO8
EO9
EP2
EP3
F5P
FDB
FEDTE
FGOYB
FIRID
FNPLU
FYGXN
G-2
G-Q
G8K
GBLVA
HMV
HVGLF
HX~
HZ~
IHE
J1W
KOM
M24
M38
M41
MAGPM
MO0
N9A
NDZJH
O-L
O9-
OAUVE
OGIMB
OZT
P-8
P-9
P2P
PC.
Q38
R2-
RIG
RNS
ROL
RPZ
SDF
SDG
SDP
SES
SEW
SMS
SPC
SPCBC
SPD
SPG
SSM
SSQ
SSZ
T5K
TWZ
VOH
WH7
WUQ
XFK
ZMT
~G-
ABPIF
ABPTK
IQODW
AAXKI
AAYXX
AFJKZ
AKRWK
CITATION
ID FETCH-LOGICAL-c399t-48a3951cb8b3b442c644d23d09eb597d6f2be4564966441d4a3093915607d91f3
IEDL.DBID .~1
ISSN 0040-6090
IngestDate Thu Sep 26 18:10:08 EDT 2024
Sun Oct 29 17:09:27 EDT 2023
Fri Feb 23 02:26:25 EST 2024
IsPeerReviewed true
IsScholarly true
Issue 2
Keywords Scanning near-field acoustic microscopy
Quartz resonator
Piezoelectric device
Acoustic microscopy
Morphology
Topography
Surface analysis
Experimental study
Resonators
Probes
Language English
License CC BY 4.0
LinkModel DirectLink
MeetingName SXM-1 : workshop on development and industrial application of scanning probe microscopes
MergedId FETCHMERGED-LOGICAL-c399t-48a3951cb8b3b442c644d23d09eb597d6f2be4564966441d4a3093915607d91f3
PageCount 4
ParticipantIDs crossref_primary_10_1016_0040_6090_95_05853_2
pascalfrancis_primary_3675400
elsevier_sciencedirect_doi_10_1016_0040_6090_95_05853_2
PublicationCentury 1900
PublicationDate 1995-08-15
PublicationDateYYYYMMDD 1995-08-15
PublicationDate_xml – month: 08
  year: 1995
  text: 1995-08-15
  day: 15
PublicationDecade 1990
PublicationPlace Lausanne
PublicationPlace_xml – name: Lausanne
PublicationTitle Thin solid films
PublicationYear 1995
Publisher Elsevier B.V
Elsevier Science
Publisher_xml – name: Elsevier B.V
– name: Elsevier Science
References Ingard, Lamb (BIB9) 1957; 29
Division of ETA SA, Mühlenstr. 14 CH-2540 Grenchen, Switzerland.
Güthner, Fischer, Dransfeld (BIB1) 1989; 48
K. Dransfeld, U.C. Fischer, P. Güthner and K. Heitmann
Nonnenmacher (BIB4) 1990
T. Murdfield, R. Volk, U.C. Fischer and H. Fuchs, in preparation.
1988.
Bartzke, Antrack, Schmidt, Dammann, Schatterny (BIB5) 1993; 8
Goch, Volk (BIB3) 1994
Aβmus, Engelhard (BIB8) 1991; 99
10.1016/0040-6090(95)05853-2_BIB7
Aβmus (10.1016/0040-6090(95)05853-2_BIB8) 1991; 99
Güthner (10.1016/0040-6090(95)05853-2_BIB1) 1989; 48
10.1016/0040-6090(95)05853-2_BIB2
Goch (10.1016/0040-6090(95)05853-2_BIB3) 1994
Ingard (10.1016/0040-6090(95)05853-2_BIB9) 1957; 29
Nonnenmacher (10.1016/0040-6090(95)05853-2_BIB4) 1990
10.1016/0040-6090(95)05853-2_BIB6
Bartzke (10.1016/0040-6090(95)05853-2_BIB5) 1993; 8
References_xml – start-page: 487
  year: 1994
  ident: BIB3
  publication-title: Anals of the CIRP 1994, Manufacturing Technology
  contributor:
    fullname: Volk
– volume: 48
  start-page: 89
  year: 1989
  ident: BIB1
  publication-title: Appl. Phys. B
  contributor:
    fullname: Dransfeld
– volume: 29
  start-page: 743
  year: 1957
  ident: BIB9
  publication-title: J. Acostical Soc. Am.
  contributor:
    fullname: Lamb
– year: 1990
  ident: BIB4
  publication-title: Ph.D. Thesis
  contributor:
    fullname: Nonnenmacher
– volume: 99
  start-page: 421
  year: 1991
  ident: BIB8
  publication-title: Feinwerktech. Meβtech.
  contributor:
    fullname: Engelhard
– volume: 8
  start-page: 669
  year: 1993
  ident: BIB5
  publication-title: Int. J. Optoelectron.
  contributor:
    fullname: Schatterny
– ident: 10.1016/0040-6090(95)05853-2_BIB7
– start-page: 487
  year: 1994
  ident: 10.1016/0040-6090(95)05853-2_BIB3
  publication-title: Anals of the CIRP 1994, Manufacturing Technology
  doi: 10.1016/S0007-8506(07)62259-8
  contributor:
    fullname: Goch
– ident: 10.1016/0040-6090(95)05853-2_BIB6
– volume: 99
  start-page: 421
  issue: 10
  year: 1991
  ident: 10.1016/0040-6090(95)05853-2_BIB8
  publication-title: Feinwerktech. Meβtech.
  contributor:
    fullname: Aβmus
– ident: 10.1016/0040-6090(95)05853-2_BIB2
– year: 1990
  ident: 10.1016/0040-6090(95)05853-2_BIB4
  contributor:
    fullname: Nonnenmacher
– volume: 48
  start-page: 89
  year: 1989
  ident: 10.1016/0040-6090(95)05853-2_BIB1
  publication-title: Appl. Phys. B
  doi: 10.1007/BF00694423
  contributor:
    fullname: Güthner
– volume: 29
  start-page: 743
  issue: 6
  year: 1957
  ident: 10.1016/0040-6090(95)05853-2_BIB9
  publication-title: J. Acostical Soc. Am.
  doi: 10.1121/1.1909034
  contributor:
    fullname: Ingard
– volume: 8
  start-page: 669
  year: 1993
  ident: 10.1016/0040-6090(95)05853-2_BIB5
  publication-title: Int. J. Optoelectron.
  contributor:
    fullname: Bartzke
SSID ssj0001223
Score 1.5803337
Snippet The feasibility of a rod-shaped 1 MHz length extension quartz resonator as a probe for scanning near-field acoustic microscopy was investigated. A corner of...
SourceID crossref
pascalfrancis
elsevier
SourceType Aggregation Database
Index Database
Publisher
StartPage 172
SubjectTerms Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Quartz resonator
Scanning near-field acoustic microscopy
Solid surfaces and solid-solid interfaces
Surface structure and topography
Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)
Title 1 MHz quartz length extension resonator as a probe for scanning near-field acoustic microscopy
URI https://dx.doi.org/10.1016/0040-6090(95)05853-2
Volume 264
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1BS8MwFA6iCIqITsWpGzl40ENcm6RdexziqI7tIA53sjRpizvYza0e3MHf7ntpO7eDCJ4KoU3LS_Lle-n33iPk0hOe1Jq7sL5hkUvtCQYYqJi2bZ3AfivtGKOR-wM3GMqHkTNaiYVBWWWJ_QWmG7QuW1qlNVvT8Riz8liu5QNFsIDyCoRhCXsRTOmbrx-Vh835UjiHd1fRc7bbWrZd-c616YPx33anvWk0B5ulRbGLlR2oe0D2S-pIO8XXHZKNJKuR3ZWEgjWybQSden5EXmzaDxb0HTWbC4rlUvJXak688XiMgpONx-aTGY3mNKJYViahwF8pvN8UMaIZLAFm9G0UQNPU_KJvqN7DOJbPYzLs3j3dBqyspcA0UJCcSS8SQKa08pRQUnINPCjmIrb8RIFPEbspVwmmlgH3BxhSLCP8RepjnHU79u1UnJDNbJIlp4QKrjAwD6ikBrKlXV8krowcoSOu0lildcIqG4bTImVGWGnJ0OYh2jz0ndDYPOR10q4MHa4NfQio_seTjbVxWb5OgBsE4HT2757PyU4Ruw4utnNBNvPZR9IA9pGrpplfTbLVue8FA7z2Hp9734pc1Jc
link.rule.ids 310,311,315,786,790,795,796,4521,23958,23959,24144,25170,27957,27958,45620,45714
linkProvider Elsevier
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV2xTsMwELUQCAFCCAqIAgUPDDCEJraTJiNCVAHaTq3UCSt2EtGBtLRhoAPfzp2TlHZASKxWYkfn-Pmd_e6OkCuf-0Jr5sH6hkUutM8twEBlacfRCey3wokxGrnb88KBeBq6w6VYGJRVlthfYLpB67KlWVqzORmNMCuP7dkBUAQbKC8HGN5ANo_lG26_fmQeDmML5Rw-XoXPOV5z0XYduDemE4v9tj3tTqIZGC0tql0sbUHtfbJXckd6V3zeAVlLshrZWcooWCObRtGpZ4fkxaHdcE7fUbQ5p1gvJX-l5sgbz8coeNl4bj6e0mhGI4p1ZRIKBJbC-KaKEc1gDVhG4EYBNU3RL_qG8j0MZPk8IoP2Q_8-tMpiCpYGDpJbwo84sCmtfMWVEEwDEYoZj-0gUeBUxF7KVIK5ZcD_AYoUiwjvSAMMtG7FgZPyY7KejbPkhFDOFEbmAZfUwLa0F_DEE5HLdcRUGqu0TqzKhnJS5MyQlZgMbS7R5jJwpbG5ZHXSqgwtV-ZeAqz_8WZjZV4Ww3HwgwCdTv_d8yXZCvvdjuw89p7PyHYRyA7-tntO1vPpR9IAKpKrC_OvfQP0l9SG
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=proceeding&rft.title=Thin+solid+films&rft.atitle=1+MHz+quartz+length+extension+resonator+as+a+probe+for+scanning+near-field+acoustic+microscopy&rft.au=MICHELS%2C+A&rft.au=MEINEN%2C+F&rft.au=MURDFIELD%2C+T&rft.au=G%C3%96HDE%2C+W&rft.date=1995-08-15&rft.pub=Elsevier+Science&rft.issn=0040-6090&rft.eissn=1879-2731&rft.volume=264&rft.issue=2&rft.spage=172&rft.epage=175&rft_id=info:doi/10.1016%2F0040-6090%2895%2905853-2&rft.externalDBID=n%2Fa&rft.externalDocID=3675400
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0040-6090&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0040-6090&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0040-6090&client=summon