XPS analysis of uncoated and silica-coated titanium dioxide powders

• Published in: Colloids and surfaces Vol. 7; no. 4; pp. 311 - 323
• Main Authors: Egerton, T.A., Parfitt, G.D., Kang, Yoonok, Wightman, J.P.
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 01.01.1983; Elsevier
• Subjects: Chemistry; Colloidal state and disperse state; Exact sciences and technology; General and physical chemistry; Physical and chemical studies. Granulometry. Electrokinetic phenomena; Titanium IV Oxides; Transition metal Compounds; Photoelectron spectrometry; Solid particle; X ray; Metal Oxides; Surface analysis; Coatings; Silica; Powder; Modified material

The surface chemical composition of various SiO 2-coated titanium dioxide powders was probed by X-ray photoelectron spectroscopy (XPS). The titanium photopeak was detected in addition to the silicon photopeak indicating that the thickness of the SiO 2 coating was < 5 nm. The detection of two diff...