XPS analysis of uncoated and silica-coated titanium dioxide powders

• Published in: Colloids and surfaces Vol. 7; no. 4; pp. 311 - 323
• Main Authors: Egerton, T.A., Parfitt, G.D., Kang, Yoonok, Wightman, J.P.
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 01.01.1983; Elsevier
• Subjects: Chemistry; Colloidal state and disperse state; Exact sciences and technology; General and physical chemistry; Physical and chemical studies. Granulometry. Electrokinetic phenomena; Titanium IV Oxides; Transition metal Compounds; Photoelectron spectrometry; Solid particle; X ray; Metal Oxides; Surface analysis; Coatings; Silica; Powder; Modified material
• ISSN: 0166-6622; 1873-4340
• DOI: 10.1016/0166-6622(83)80058-4

The surface chemical composition of various SiO 2-coated titanium dioxide powders was probed by X-ray photoelectron spectroscopy (XPS). The titanium photopeak was detected in addition to the silicon photopeak indicating that the thickness of the SiO 2 coating was < 5 nm. The detection of two different oxides on the coated surfaces was further verified by the doublet oxygen 1s photopeak. The binding energies of each oxygen photopeak coincided well with the oxygen photopeaks from SiO 2 and TiO 2 powders. By means of angular resolved analysis, it was shown that SiO 2 was indeed concentrated on the surface of TiO 2 powder. Also, a good correlation was observed between the magnitude of the Si 2p photoelectron peak area and wt% SiO 2, present on the TiO 2 powder.