XPS analysis of uncoated and silica-coated titanium dioxide powders

The surface chemical composition of various SiO 2-coated titanium dioxide powders was probed by X-ray photoelectron spectroscopy (XPS). The titanium photopeak was detected in addition to the silicon photopeak indicating that the thickness of the SiO 2 coating was < 5 nm. The detection of two diff...

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Published inColloids and surfaces Vol. 7; no. 4; pp. 311 - 323
Main Authors Egerton, T.A., Parfitt, G.D., Kang, Yoonok, Wightman, J.P.
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 01.01.1983
Elsevier
Subjects
Chemistry
Colloidal state and disperse state
Exact sciences and technology
General and physical chemistry
Physical and chemical studies. Granulometry. Electrokinetic phenomena
Titanium IV Oxides
Transition metal Compounds
Photoelectron spectrometry
Solid particle
X ray
Metal Oxides
Surface analysis
Coatings
Silica
Powder
Modified material
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Abstract The surface chemical composition of various SiO 2-coated titanium dioxide powders was probed by X-ray photoelectron spectroscopy (XPS). The titanium photopeak was detected in addition to the silicon photopeak indicating that the thickness of the SiO 2 coating was < 5 nm. The detection of two different oxides on the coated surfaces was further verified by the doublet oxygen 1s photopeak. The binding energies of each oxygen photopeak coincided well with the oxygen photopeaks from SiO 2 and TiO 2 powders. By means of angular resolved analysis, it was shown that SiO 2 was indeed concentrated on the surface of TiO 2 powder. Also, a good correlation was observed between the magnitude of the Si 2p photoelectron peak area and wt% SiO 2, present on the TiO 2 powder.
AbstractList The surface chemical composition of various SiO 2-coated titanium dioxide powders was probed by X-ray photoelectron spectroscopy (XPS). The titanium photopeak was detected in addition to the silicon photopeak indicating that the thickness of the SiO 2 coating was < 5 nm. The detection of two different oxides on the coated surfaces was further verified by the doublet oxygen 1s photopeak. The binding energies of each oxygen photopeak coincided well with the oxygen photopeaks from SiO 2 and TiO 2 powders. By means of angular resolved analysis, it was shown that SiO 2 was indeed concentrated on the surface of TiO 2 powder. Also, a good correlation was observed between the magnitude of the Si 2p photoelectron peak area and wt% SiO 2, present on the TiO 2 powder.
Author Kang, Yoonok
Parfitt, G.D.
Wightman, J.P.
Egerton, T.A.
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CitedBy_id crossref_primary_10_1002_sia_740170503
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10.1016/0368-2048(74)85048-6
10.1016/0368-2048(76)80015-1
10.1021/j100449a004
10.1016/0039-9140(80)80168-8
10.1002/sia.740010106
10.1016/0368-2048(74)85025-5
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Issue 4
Keywords Titanium IV Oxides
Transition metal Compounds
Photoelectron spectrometry
Solid particle
X ray
Metal Oxides
Surface analysis
Coatings
Silica
Powder
Modified material
Language English
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Snippet The surface chemical composition of various SiO 2-coated titanium dioxide powders was probed by X-ray photoelectron spectroscopy (XPS). The titanium photopeak...
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SubjectTerms Chemistry
Colloidal state and disperse state
Exact sciences and technology
General and physical chemistry
Physical and chemical studies. Granulometry. Electrokinetic phenomena
Title XPS analysis of uncoated and silica-coated titanium dioxide powders
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