Photosintering and electrical performance of CuO nanoparticle inks
[Display omitted] •We evaluate photosintering effectiveness of copper oxide nanoparticle ink.•We evaluate the effect of line-width on sheet resistance (100, 200 and 300 microns).•Ink evaporation impacts the effectiveness of the reducing agent in CuO ink.•Evaporation rate varies as a function of feat...
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Published in | Organic electronics Vol. 15; no. 8; pp. 1836 - 1842 |
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Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
Amsterdam
Elsevier B.V
01.08.2014
Elsevier |
Subjects | |
Online Access | Get full text |
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Summary: | [Display omitted]
•We evaluate photosintering effectiveness of copper oxide nanoparticle ink.•We evaluate the effect of line-width on sheet resistance (100, 200 and 300 microns).•Ink evaporation impacts the effectiveness of the reducing agent in CuO ink.•Evaporation rate varies as a function of feature size (line-width).•Circuits with drastically different feature sizes may require special considerations.
A copper oxide (CuO) nanoparticle ink was inkjet printed and photosintered in order to optimize electrical performance as a function of pattern dimension. For a given photosintering condition, electrical conductance varied strongly with line widths, ranging from 100 to 300μm, illustrating the implications of printing and sintering complex circuit designs with varying feature sizes. By tuning the time delay between printing and sintering, exposure wavelength, radiant energy, pulse width and the distance between the light-source and substrate, photosintering conditions were optimized so that variations in sheet resistance for different line widths were minimized. Using optimized photosintering conditions, a sheet resistance value as low as 150mΩ/□ (resistivity of 9μΩcm) and current carrying capacity of 280mA for a 300μm wide trace was achieved. |
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ISSN: | 1566-1199 1878-5530 |
DOI: | 10.1016/j.orgel.2014.05.014 |