CdTe semiconductor X-ray imaging sensor and energy subtraction method using X-ray energy information

A multichannel X-ray imaging sensor using a CdTe compound semiconductor radiation detector was developed. Both the digital X-ray imaging and energy-information-generating analyzing method were studied. The X-ray imaging sensor consisted of 512-channel CdTe detector elements at a pitch of 0.2 mm. X-r...

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Bibliographic Details
Published inIEEE transactions on nuclear science Vol. 40; no. 2; pp. 95 - 101
Main Authors Tsutsui, H., Ohtsuchi, T., Ohmori, K., Baba, S.
Format Journal Article
LanguageEnglish
Published New York, NY IEEE 01.04.1993
Institute of Electrical and Electronics Engineers
Subjects
420500 - Engineering- Materials Testing
440101 - Radiation Instrumentation- General Detectors or Monitors & Radiometric Instruments
CDTE SEMICONDUCTOR DETECTORS
DESIGN
ELECTROMAGNETIC RADIATION
Energy resolution
ENGINEERING
Exact sciences and technology
FEASIBILITY STUDIES
Image analysis
IMAGE INTENSIFIERS
Image sensors
INDUSTRIAL RADIOGRAPHY
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
IONIZING RADIATIONS
MEASURING INSTRUMENTS
Optoelectronic and photonic sensors
Physics
RADIATION DETECTORS
RADIATIONS
Radiography
SEMICONDUCTOR DETECTORS
Semiconductor radiation detectors
Sensor arrays
X RADIATION
X- and γ-ray instruments and techniques
X-ray detection
X-ray detectors
X-ray imaging
X-RAY RADIOGRAPHY
X radiation
Radiation detectors
Imagery
X-ray radiography
Cadmium tellurides
CdTe semiconductor detectors
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Summary:A multichannel X-ray imaging sensor using a CdTe compound semiconductor radiation detector was developed. Both the digital X-ray imaging and energy-information-generating analyzing method were studied. The X-ray imaging sensor consisted of 512-channel CdTe detector elements at a pitch of 0.2 mm. X-ray photons were directly detected using a photon-counting method and high- and low-energy images were obtained simultaneously. The specific resolution was obtained over 2.5 line pairs/mm in the channel direction and 1.6 line pairs/mm in the scanning direction with a scanning pitch of 0.2 mm. The energy subtraction method was found to be effective in distinguishing an object's component materials.< >
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0018-9499
1558-1578
DOI:10.1109/23.212323