Current fluctuations due to locally distributed charge generation in semiconductor junctions: A theoretical study

Saved in:
Bibliographic Details
Published inSolid-state electronics Vol. 36; no. 9; pp. 1362 - 1364
Main Author Niemcharoen, S.
Format Journal Article
LanguageEnglish
Published Oxford Elsevier Ltd 01.09.1993
Elsevier Science
Subjects
Applied sciences
Diodes
Electronics
Exact sciences and technology
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Semiconductor device
Noise
Charge carrier recombination
Theoretical study
Charge carrier generation
Semiconductor diode
Electric current
Online AccessGet full text

Cover

More Information
ISSN:0038-1101
1879-2405
DOI:10.1016/0038-1101(93)90180-X