Properties of polyimide, polyetheretherketone and polyethyleneterephthalate implanted by Ni ions to high fluences

• Published in: Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Vol. 272; pp. 396 - 399
• Main Authors: Malinsky, P., Mackova, A., Hnatowicz, V., Khaibullin, R.I., Valeev, V.F., Slepicka, P., Svorcik, V., Slouf, M., Perina, V.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.02.2012
• Subjects: AFM; Annealing; Depth profiles; Nanocomposites; Nanomaterials; Nanostructure; Ni ion implantation; Nickel; Polyetheretherketones; Polyimide resins; Polymers; RBS; TEM; Ni ion implantation; AFM; RBS; Polymers; Depth profiles; TEM
• ISSN: 0168-583X; 1872-9584
• DOI: 10.1016/j.nimb.2011.01.109

Polyimide (PI), polyetheretherketone (PEEK) and polyethyleneterephthalate (PET) were implanted with 40 keV Ni + ions at RT to the fluences (0.25–1.5) × 10 17 cm −2 at ion current density of 4 μA cm −2. Then some of the samples were annealed at the temperatures close to the polymer glassy transition temperature. Depth profiles of the Ni atoms in the as implanted and annealed samples were determined by RBS method. The profiles in the as implanted samples agree reasonably with those simulated using TRYDIN code. The implanted Ni atoms tend to aggregate into nano-particles, the size and distribution of which was determined from TEM images. The nano-particle size increases with increasing ion fluence. Subsequent annealing leads to a reduction in the nanoparticle size. The surface morphology of the implanted and annealed samples was studied using AFM. The changes in the polymer sheet resistance of the implanted and annealed samples were measured by standard two-point technique. The sheet resistance decreases with increasing temperature of annealing.