Experimental study of diffusion and segregation in a Si-(GexSi1-x) heterostructure

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Bibliographic Details
Published inPhysical review letters Vol. 67; no. 11; p. 1450
Main Authors Hu, SM, Ahlgren, DC, Ronsheim, PA, Chu, JO
Format Journal Article
LanguageEnglish
Published United States 09.09.1991
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ISSN:1079-7114
DOI:10.1103/physrevlett.67.1450