Microstructural characterization of transformable Fe–Mn alloys at different length scales

• Published in: Materials characterization Vol. 60; no. 11; pp. 1224 - 1231
• Main Authors: Liang, X., Wang, X., Zurob, H.S.
• Format: Journal Article
• Language: English
• Published: New York, NY Elsevier Inc 01.11.2009; Elsevier
• Subjects: ANNEALING; BACKSCATTERING; CORRELATIONS; Cross-disciplinary physics: materials science; rheology; CRYSTAL DEFECTS; CRYSTALS; Differential interference contrast technique; Electron back-scattered diffraction; ELECTRON DIFFRACTION; ETCHING; Exact sciences and technology; Fe–Mn alloys; INTERFERENCE; IRON ALLOYS; LENGTH; MANGANESE ALLOYS; MATERIALS SCIENCE; METALLOGRAPHY; MICROSTRUCTURE; MORPHOLOGY; Phase diagrams and microstructures developed by solidification and solid-solid phase transformations; PHASE STUDIES; PHASE TRANSFORMATIONS; Physics; SCANNING ELECTRON MICROSCOPY; Solidification; Tint etching; TRANSMISSION ELECTRON MICROSCOPY; Tint etching; Electron back-scattered diffraction; Scanning electron microscopy; Transmission electron microscopy; Differential interference contrast technique; Fe–Mn alloys; Electron diffraction; Differential interference; Fe-Mn alloys; contrast technique; Microstructure
• ISSN: 1044-5803; 1873-4189
• DOI: 10.1016/j.matchar.2009.04.015

The as-annealed and deformed Microstructure of transformable Fe–Mn alloys were, comprehensively, characterized over a wide range of length scales. Differential interference contrast optical metallography, combined with a tinting etching method, was employed to examine the grain morphology. A new specimen preparation method, involving electro-polishing and electro-etching, was developed for scanning electron microscopy and electron back-scattered diffraction analysis. This method leads to a very good imaging contrast and thus bridges the length scale gap between optical metallography and transmission electron microscopy. Moreover, it enables simultaneous scanning electron microscopy and electron backscatter diffraction analysis which allows correlations among morphology, crystal orientation and phase analysis in the length scale of microns. Transmission electron microscopy investigations were also made to evaluate the thermal and mechanical transformation products as well as defect structures.