Trace element profiling of gunshot residues by PIXE and SEM-EDS: a feasibility study
A feasibility study was carried out into the use of particle‐induced x‐ray emission (PIXE) on the ion microprobe for the characterisation of gunshot residues (GSR). We compare these results with the conventional technique, scanning electron microscopy with energy dispersive x‐ray spectroscopy (SEM‐E...
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Published in | X-ray spectrometry Vol. 38; no. 3; pp. 190 - 194 |
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Main Authors | , , |
Format | Journal Article Conference Proceeding |
Language | English |
Published |
Chichester, UK
John Wiley & Sons, Ltd
01.05.2009
Wiley |
Subjects | |
Online Access | Get full text |
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Summary: | A feasibility study was carried out into the use of particle‐induced x‐ray emission (PIXE) on the ion microprobe for the characterisation of gunshot residues (GSR). We compare these results with the conventional technique, scanning electron microscopy with energy dispersive x‐ray spectroscopy (SEM‐EDS). Samples of gunshot residue from four different sources were collected. Individual particles of GSR were analysed by SEM‐EDS using a 30‐keV electron beam focussed to ∼10 nm, and PIXE using a 2.5‐MeV proton beam focussed to ∼4 µm. PIXE revealed trace or minor elements undetectable by SEM‐EDS, thereby strengthening the discrimination between different types of GSR. Copyright © 2009 John Wiley & Sons, Ltd. |
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Bibliography: | ArticleID:XRS1142 ark:/67375/WNG-1MZV401T-R istex:8758C2E1A018007C67FFBECA026B642DCC43FFFF ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0049-8246 1097-4539 |
DOI: | 10.1002/xrs.1142 |