Ion-beam analysis for cultural heritage on the AGLAE facility: impact of PIXE/RBS combination

• Published in: Applied physics. A, Materials science & processing Vol. 92; no. 1; pp. 43 - 50
• Main Authors: Salomon, J., Dran, J.-C., Guillou, T., Moignard, B., Pichon, L., Walter, P., Mathis, F.
• Format: Journal Article Web Resource
• Language: English
• Published: Berlin/Heidelberg Springer-Verlag 01.07.2008; Springer Science & Business Media B.V
• Subjects: Characterization and Evaluation of Materials; Condensed Matter Physics; Machines; Manufacturing; Nanotechnology; Optical and Electronic Materials; Physical, chemical, mathematical & earth Sciences; Physics; Physics and Astronomy; Physique, chimie, mathématiques & sciences de la terre; Processes; Surfaces and Interfaces; Thin Films; PIXE; Simultaneous Implementation; PIXE Analysis; Nuclear Reaction Analysis; Cultural Heritage Object
• ISSN: 0947-8396; 1432-0630; 1432-0630
• DOI: 10.1007/s00339-008-4512-4

The combination of particle-induced X-ray emission (PIXE) and Rutherford backscattering (RBS) is particularly fruitful for the study of cultural heritage objects. Several set-ups have been developed at the AGLAE facility of the Louvre Laboratory to implement these techniques with an external beam. Successively have been tested the simultaneous use of PIXE and RBS with a single beam of protons, the sequential application of PIXE with protons and RBS with 4 He 2+ ions and finally the simultaneous implementation of PIXE and RBS with high-energy 4 He 2+ ions. Several examples illustrate the benefits of these combinations of techniques.