Effect of Processing Conditions on the Dielectric and Raman Response of Electroactive Polymers
The relationship between the molecular and crystalline structure and the dielectric response of hot-pressed PVDF film and the films cast from N,N-dimethylacetamide solution was studied by means of wide angle X-ray scattering, Raman and dielectric spectroscopy. We have found that the degree of crysta...
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Published in | Ferroelectrics Vol. 405; no. 1; pp. 138 - 145 |
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Main Authors | , , , , |
Format | Journal Article Conference Proceeding |
Language | English |
Published |
Colchester
Taylor & Francis Group
01.01.2010
Taylor & Francis Taylor & Francis Ltd |
Subjects | |
Online Access | Get full text |
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Summary: | The relationship between the molecular and crystalline structure and the dielectric response of hot-pressed PVDF film and the films cast from N,N-dimethylacetamide solution was studied by means of wide angle X-ray scattering, Raman and dielectric spectroscopy. We have found that the degree of crystallinity of hot-pressed PVDF is by about 10% higher than that of solution-cast films, which results in a decrease in the activation energy of segmental motions and a rise in the freezing temperature. We have also observed that the solution-cast samples are more reach in sequences containing trans conformation (T)
n
G with n ≥ 3 which leads to an increase in their permittivity value. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 0015-0193 1563-5112 |
DOI: | 10.1080/00150193.2010.483192 |