Effect of Processing Conditions on the Dielectric and Raman Response of Electroactive Polymers

The relationship between the molecular and crystalline structure and the dielectric response of hot-pressed PVDF film and the films cast from N,N-dimethylacetamide solution was studied by means of wide angle X-ray scattering, Raman and dielectric spectroscopy. We have found that the degree of crysta...

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Published inFerroelectrics Vol. 405; no. 1; pp. 138 - 145
Main Authors Połomska, Maria, Hilczer, Bożena, Markiewicz, Ewa, Pogorzelec-Glaser, Katarzyna, Pietraszko, Adam
Format Journal Article Conference Proceeding
LanguageEnglish
Published Colchester Taylor & Francis Group 01.01.2010
Taylor & Francis
Taylor & Francis Ltd
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Summary:The relationship between the molecular and crystalline structure and the dielectric response of hot-pressed PVDF film and the films cast from N,N-dimethylacetamide solution was studied by means of wide angle X-ray scattering, Raman and dielectric spectroscopy. We have found that the degree of crystallinity of hot-pressed PVDF is by about 10% higher than that of solution-cast films, which results in a decrease in the activation energy of segmental motions and a rise in the freezing temperature. We have also observed that the solution-cast samples are more reach in sequences containing trans conformation (T) n G with n ≥ 3 which leads to an increase in their permittivity value.
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ISSN:0015-0193
1563-5112
DOI:10.1080/00150193.2010.483192