Magnetic properties of Fe microstructures with focused ion beam-fabricated nano-constrictions

• Published in: IEEE transactions on magnetics Vol. 37; no. 4; pp. 2101 - 2103
• Main Authors: Roshchin, I.V., Yu, J., Kent, A.D., Stupian, G.W., Leung, M.S.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: New York, NY IEEE 01.07.2001; Institute of Electrical and Electronics Engineers; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Applied sciences; Constrictions; Electronics; Exact sciences and technology; Fabrication; Ion beams; Iron; Lithography; Magnetic films; Magnetic force microscopy; Magnetic properties; Magnetism; Magnetooptic effects; Micro- and nanoelectromechanical devices (mems/nems); Microstructure; Nanocomposites; Nanomaterials; Nanostructure; Preserves; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Wire; Magnetization reversal; Atomic force microscopy; Scanning electron microscopy; Iron; Nanostructure; Epitaxial film; Kerr magnetooptical effect; Experimental study; Focused ion beam technology; Magnetic thin films; Magnetic force microscopy; Thin film; Microstructure; Nanotechnology; Magnetic properties
• ISSN: 0018-9464; 1941-0069
• DOI: 10.1109/20.951066

Studies of the magnetic properties of Fe microfabricated wires with a mechanically stable 40 to 120 nm-wide constriction produced with focused ion beam are reported. The 2 to 20 /spl mu/m-wide wires are fabricated by photolithography from 3 nm and 25 nm-thick epitaxial [110] bcc Fe films. This fabrication method appears to preserve the magnetic properties of the constriction. The structures are studied by MFM and by magneto-optic Kerr effect (MOKE) measurements. The ratio of the wire linewidth to its thickness determines the demagnetization factor and, therefore, influences the coercivity of the wire. Both a step in the width of the wire and a nano-constriction in the middle of the wire are found to be domain wall (DW) pinning centers.