Ultra slow muon microscopy by laser resonant ionization at J-PARC, MUSE

• Published in: Hyperfine interactions Vol. 216; no. 1-3; pp. 79 - 83
• Main Authors: Miyake, Y., Ikedo, Y., Shimomura, K., Strasser, P., Kawamura, N., Nishiyama, K., Koda, A., Fujimori, H., Makimura, S., Nakamura, J., Nagatomo, T., Kadono, R., Torikai, E., Iwasaki, M., Wada, S., Saito, N., Okamura, K., Yokoyama, K., Ito, T., Higemoto, W.
• Format: Journal Article
• Language: English
• Published: Dordrecht Springer Netherlands 01.04.2013
• Subjects: Atomic; Condensed Matter Physics; Hadrons; Heavy Ions; Molecular; Nuclear Physics; Optical and Plasma Physics; Physics; Physics and Astronomy; Surfaces and Interfaces; Thin Films; Ultra slow muon; J-PARC; Muon; Pulsed laser; VUV; Resonant ionization
• ISSN: 0304-3843; 1572-9540
• DOI: 10.1007/s10751-012-0759-4

As one of the principal muon beam line at the J-PARC muon facility (MUSE), we are now constructing a Muon beam line (U-Line), which consists of a large acceptance solenoid made of mineral insulation cables (MIC), a superconducting curved transport solenoid and superconducting axial focusing magnets. There, we can extract 2 × 10 8 /s surface muons towards a hot tungsten target. At the U-Line, we are now establishing a new type of muon microscopy; a new technique with use of the intense ultra-slow muon source generated by resonant ionization of thermal Muonium (designated as Mu; consisting of a μ  +  and an e  −  ) atoms generated from the surface of the tungsten target. In this contribution, the latest status of the Ultra Slow Muon Microscopy project, fully funded, is reported.