Long-term aging of oscillators
The authors report aging results for more than 40 oscillators, from a variety of sources, for periods ranging from 1 yr to more than 10 yr. The aging data were accumulated with an automated aging facility. The oscillators that have been tested include temperature-compensated crystal oscillators (TCX...
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Published in | IEEE transactions on ultrasonics, ferroelectrics, and frequency control Vol. 40; no. 4; pp. 387 - 394 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
New York, NY
IEEE
01.07.1993
Institute of Electrical and Electronics Engineers |
Subjects | |
Online Access | Get full text |
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Summary: | The authors report aging results for more than 40 oscillators, from a variety of sources, for periods ranging from 1 yr to more than 10 yr. The aging data were accumulated with an automated aging facility. The oscillators that have been tested include temperature-compensated crystal oscillators (TCXOs) and oven-controlled crystal oscillators (OCXOs). The TCXOs were maintained in a controlled temperature environment. Several of the TCXOs were built for a gun-launched sensor application and have been shown to be capable of surviving more than 30000-g shock levels of 12-ms duration. The aging results for these ruggedized TXCOs are surprisingly good (<2*10/sup -10//d). The better OCXOs exhibit long term aging of a few parts in 10/sup 12//d.< > |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 ObjectType-Article-1 ObjectType-Feature-2 |
ISSN: | 0885-3010 1525-8955 |
DOI: | 10.1109/58.251287 |