Systematic determination of the propagation characteristics of coplanar lines on semiconductor substrate

• Published in: IEEE transactions on microwave theory and techniques Vol. 39; no. 7; pp. 1083 - 1089
• Main Authors: Pribetich, P., Seguinot, C., Kennis, P.
• Format: Journal Article
• Language: English
• Published: New York, NY IEEE 01.07.1991; Institute of Electrical and Electronics Engineers
• Subjects: Applied sciences; Attenuation; Circuit properties; Coplanar transmission lines; Dispersion; Electric, optical and optoelectronic circuits; Electronics; Exact sciences and technology; Frequency; Impedance; Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits; Propagation constant; Schottky barriers; Testing; Transmission line theory; Waveguide discontinuities; Measurement; Propagation; Characteristic impedance; Performance characteristic; Microwave; Coplanar line; Experimental study; Waveguide; Semiconductor device; Transmission line; Slow wave structure; Measurement method; Computer aided design

A method allowing the systematic determination of the propagation characteristics of micron-size waveguides and overcoming the influence of feeding access discontinuities is presented. The complex propagation constant and characteristic impedance of a slow-wave Schottky contact coplanar line are det...