Systematic determination of the propagation characteristics of coplanar lines on semiconductor substrate

• Published in: IEEE transactions on microwave theory and techniques Vol. 39; no. 7; pp. 1083 - 1089
• Main Authors: Pribetich, P., Seguinot, C., Kennis, P.
• Format: Journal Article
• Language: English
• Published: New York, NY IEEE 01.07.1991; Institute of Electrical and Electronics Engineers
• Subjects: Applied sciences; Attenuation; Circuit properties; Coplanar transmission lines; Dispersion; Electric, optical and optoelectronic circuits; Electronics; Exact sciences and technology; Frequency; Impedance; Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits; Propagation constant; Schottky barriers; Testing; Transmission line theory; Waveguide discontinuities; Measurement; Propagation; Characteristic impedance; Performance characteristic; Microwave; Coplanar line; Experimental study; Waveguide; Semiconductor device; Transmission line; Slow wave structure; Measurement method; Computer aided design
• ISSN: 0018-9480; 1557-9670
• DOI: 10.1109/22.85373

A method allowing the systematic determination of the propagation characteristics of micron-size waveguides and overcoming the influence of feeding access discontinuities is presented. The complex propagation constant and characteristic impedance of a slow-wave Schottky contact coplanar line are determined in the 1 to 26 GHz frequency range under different DC bias conditions. This method is successfully used to characterize the Schottky contact coplanar line of micron size under drastic conditions, that is, high value of slow-wave factor, significant attenuation, dispersive transmission line, and strong mismatches between feeding line and device under test. Comparisons with transmission line model theoretical results show very good agreement, despite the large slow-wave factor, attenuation, and dispersion of the waveguide. The electric schemes of the feeding access discontinuities are also presented.< >