Compact Diode Connected MOSFET Detector for On-Chip Millimeter-Wave Voltage Measurements

A root-mean-square diode connected MOSFET detector for estimating the signal voltage of internal nodes of millimeter-wave circuits is demonstrated. These detectors fabricated in a foundry 65 nm CMOS process provide an affordable means for RF testing, built-in self-test as well as debugging of mm-wav...

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Bibliographic Details
Published inIEEE microwave and wireless components letters Vol. 26; no. 5; pp. 349 - 351
Main Authors Kshattry, Sandeep, Choi, Wooyeol, Yu, Chikuang, Kenneth, K.O.
Format Journal Article
LanguageEnglish
Published IEEE 01.05.2016
Subjects
Circuits
CMOS
Detectors
Diodes
Gain
Impedance
Microwaves
Millimeter wave measurements
Millimeter-wave voltage measurement
MOSFET
MOSFET detector
MOSFETs
Radio frequency
RMS detector
Semiconductor device measurement
Voltage
Voltage measurement
Millimeter-wave voltage measurement
MOSFET detector
RMS detector
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Summary:A root-mean-square diode connected MOSFET detector for estimating the signal voltage of internal nodes of millimeter-wave circuits is demonstrated. These detectors fabricated in a foundry 65 nm CMOS process provide an affordable means for RF testing, built-in self-test as well as debugging of mm-wave circuits. This broadband detector operates from 80-110 GHz with detector gain of 8.5 V -1 at 60 nA bias. This in combination with high input impedance that results in less than 0.15 dB insertion loss relative to a thru structure, and a small area of 20 μm 2 makes the detector non-invasive.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
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ISSN:1531-1309
1558-1764
DOI:10.1109/LMWC.2016.2548365