Spatial carrier-fringe pattern analysis by means of wavelet transform: wavelet transform profilometry

We present an analysis of a spatial carrier-fringe pattern in three-dimensional (3-D) shape measurement by using the wavelet transform, a tool excelling for its multiresolution in the time- and space-frequency domains. To overcome the limitation of the Fourier transform, we introduce the Gabor wavel...

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Bibliographic Details
Published inApplied optics (2004) Vol. 43; no. 26; p. 4993
Main Authors Zhong, Jingang, Weng, Jiawen
Format Journal Article
LanguageEnglish
Published United States 10.09.2004
Subjects
Algorithms
Fourier Analysis
Image Enhancement - methods
Image Interpretation, Computer-Assisted - methods
Imaging, Three-Dimensional - methods
Pattern Recognition, Automated - methods
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Summary:We present an analysis of a spatial carrier-fringe pattern in three-dimensional (3-D) shape measurement by using the wavelet transform, a tool excelling for its multiresolution in the time- and space-frequency domains. To overcome the limitation of the Fourier transform, we introduce the Gabor wavelet to analyze the phase distributions of the spatial carrier-fringe pattern. The theory of wavelet transform profilometry, an accuracy check by means of a simulation, and an example of 3-D shape measurement are shown.
ISSN:1559-128X
DOI:10.1364/ao.43.004993