Spray pyrolysis deposition of indium sulphide thin films
In 2S 3 thin films were grown by the chemical spray pyrolysis (CSP) method using the pneumatic spray set-up and compressed air as a carrier gas. Aqueous solutions containing InCl 3 and SC(NH 2) 2 at a molar ratio of In/S = 1/3 and 1/6 were deposited onto preheated glass sheets at substrate temperatu...
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Published in | Thin solid films Vol. 519; no. 10; pp. 3055 - 3060 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
Amsterdam
Elsevier B.V
01.03.2011
Elsevier |
Subjects | |
Online Access | Get full text |
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Summary: | In
2S
3 thin films were grown by the chemical spray pyrolysis (CSP) method using the pneumatic spray set-up and compressed air as a carrier gas. Aqueous solutions containing InCl
3 and SC(NH
2)
2 at a molar ratio of In/S
=
1/3 and 1/6 were deposited onto preheated glass sheets at substrate temperatures T
s
=
205–410
°C. The obtained films were characterised by X-ray diffraction (XRD), scanning electron microscopy (SEM,) optical transmission spectra, X-ray photoelectron spectroscopy (XPS) and energy dispersive spectroscopy (EDS). According to XRD, thin films deposited at T
s
=
205–365
°C were composed of the (0 0 12) orientated tetragonal β-In
2S
3 phase independent of the In/S ratio in the spray solution. Depositions performed at T
s
=
410
°C led to the formation of the In
2O
3 phase, preferably when the 1/3 solution was sprayed. Post-deposition annealing in air indicated that oxidation of the sulphide phase has a minor role in the formation of In
2O
3 at temperatures up to 450
°C. In
2S
3 films grown at T
s below 365
°C exhibited transparency over 70% in the visible spectral region and E
g of 2.90–2.96
eV for direct and 2.15–2.30
eV for indirect transitions, respectively. Film thickness and chlorine content decreased with increasing deposition temperatures. The XPS study revealed that the In/S ratio in the spray solution had a significant influence on the content of oxygen (Me–O, BE
=
530.0
eV) in the In
2S
3 films deposited in the temperature range of 205–365
°C. Both XPS and EDS studies confirmed that oxygen content in the films deposited using the solution with the In/S ratio of 1/6 was substantially lower than in the films deposited with the In/S ratio of 1/3. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0040-6090 1879-2731 |
DOI: | 10.1016/j.tsf.2010.12.027 |