Spray pyrolysis deposition of indium sulphide thin films

In 2S 3 thin films were grown by the chemical spray pyrolysis (CSP) method using the pneumatic spray set-up and compressed air as a carrier gas. Aqueous solutions containing InCl 3 and SC(NH 2) 2 at a molar ratio of In/S = 1/3 and 1/6 were deposited onto preheated glass sheets at substrate temperatu...

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Bibliographic Details
Published inThin solid films Vol. 519; no. 10; pp. 3055 - 3060
Main Authors Otto, K., Katerski, A., Mere, A., Volobujeva, O., Krunks, M.
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 01.03.2011
Elsevier
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Summary:In 2S 3 thin films were grown by the chemical spray pyrolysis (CSP) method using the pneumatic spray set-up and compressed air as a carrier gas. Aqueous solutions containing InCl 3 and SC(NH 2) 2 at a molar ratio of In/S = 1/3 and 1/6 were deposited onto preheated glass sheets at substrate temperatures T s = 205–410 °C. The obtained films were characterised by X-ray diffraction (XRD), scanning electron microscopy (SEM,) optical transmission spectra, X-ray photoelectron spectroscopy (XPS) and energy dispersive spectroscopy (EDS). According to XRD, thin films deposited at T s = 205–365 °C were composed of the (0 0 12) orientated tetragonal β-In 2S 3 phase independent of the In/S ratio in the spray solution. Depositions performed at T s = 410 °C led to the formation of the In 2O 3 phase, preferably when the 1/3 solution was sprayed. Post-deposition annealing in air indicated that oxidation of the sulphide phase has a minor role in the formation of In 2O 3 at temperatures up to 450 °C. In 2S 3 films grown at T s below 365 °C exhibited transparency over 70% in the visible spectral region and E g of 2.90–2.96 eV for direct and 2.15–2.30 eV for indirect transitions, respectively. Film thickness and chlorine content decreased with increasing deposition temperatures. The XPS study revealed that the In/S ratio in the spray solution had a significant influence on the content of oxygen (Me–O, BE = 530.0 eV) in the In 2S 3 films deposited in the temperature range of 205–365 °C. Both XPS and EDS studies confirmed that oxygen content in the films deposited using the solution with the In/S ratio of 1/6 was substantially lower than in the films deposited with the In/S ratio of 1/3.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
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content type line 23
ISSN:0040-6090
1879-2731
DOI:10.1016/j.tsf.2010.12.027