GeS2 and GeSe2 PECVD from GeCl4 and Various Chalcogenide Precursors

• Published in: Plasma chemistry and plasma processing Vol. 34; no. 4; pp. 755 - 766
• Main Authors: Whitham, Patrick J., Strommen, Dennis P., Lundell, Sandra, Lau, Lisa D., Rodriguez, Rene
• Format: Journal Article
• Language: English
• Published: Boston Springer US 2014
• Subjects: Characterization and Evaluation of Materials; Chemistry; Chemistry and Materials Science; Classical Mechanics; Inorganic Chemistry; Mechanical Engineering; Original Paper; PECVD; Germanium sulfide; Germanium selenide; Alkylsulfide
• ISSN: 0272-4324; 1572-8986
• DOI: 10.1007/s11090-014-9542-4

The plasma enhanced chemical vapor depositions of germanium chalcogenide thin films from germanium tetrachloride, hydrogen sulfide and alkyl chalcogenides were studied to determine the viability of these reagents for thin film deposition. Hydrogen sulfide is a commonly used reagent for this technique and was used to determine optimal reaction conditions for thin film deposition. Germanium tetrachloride, alkylsulfides and alkylselenides were also employed because of their lower potential toxicities and higher availabilities compared to their more typical congeners: germane, hydrogen sulfide and hydrogen selenide in the formation of germanium chalcogenides. Alkylsulfides were found to be unsuitable for the deposition of germanium sulfides, however alkylselenide precursors were used successfully for the deposition of germanium selenides. The relative mass flow rates, reactor pressure, substrate temperature and plasma power density were studied for their effects on germanium chalcogenide deposition. These parameters affected the composition, deposition rate, film quality, and spectroscopic properties of the deposited films.