Line scan--structured illumination microscopy super-resolution imaging in thick fluorescent samples

Structured illumination microscopy in thick fluorescent samples is a challenging task. The out-of-focus fluorescence background deteriorates the illumination pattern and the reconstructed images suffer from influence of noise. We present a combination of structured illumination microscopy with line...

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Bibliographic Details
Published inOptics express Vol. 20; no. 22; pp. 24167 - 24174
Main Authors Mandula, Ondrej, Kielhorn, Martin, Wicker, Kai, Krampert, Gerhard, Kleppe, Ingo, Heintzmann, Rainer
Format Journal Article
LanguageEnglish
Published United States 22.10.2012
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Summary:Structured illumination microscopy in thick fluorescent samples is a challenging task. The out-of-focus fluorescence background deteriorates the illumination pattern and the reconstructed images suffer from influence of noise. We present a combination of structured illumination microscopy with line scanning. This technique reduces the out-of-focus fluorescence background, which improves the modulation and the quality of the illumination pattern and therefore facilitates the reconstruction. We present super-resolution, optically sectioned images of a thick fluorescent sample, revealing details of the specimen's inner structure.
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content type line 23
ISSN:1094-4087
1094-4087
DOI:10.1364/oe.20.024167