CVD diamond films for radiation detection

• Published in: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 41; no. 4; pp. 927 - 932
• Main Authors: Foulon, F., Pochet, T., Gheeraert, E., Deneuville, A.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: New York, NY IEEE 01.08.1994; Institute of Electrical and Electronics Engineers
• Subjects: ALPHA DETECTION; Alpha particles; Applied sciences; Bolometer; infrared, submillimeter wave, microwave and radiowave receivers and detectors; Bolometers; infrared, submillimeter wave, microwave, and radiowave receivers and detectors; CHARGED PARTICLE DETECTION; Chemical vapor deposition; Conductivity; DATA; DETECTION; ELECTRICAL PROPERTIES; Electronics; Exact sciences and technology; EXPERIMENTAL DATA; Experimental methods and instrumentation for elementary-particle and nuclear physics; FABRICATION; FUNCTIONS; Fundamental areas of phenomenology (including applications); Imaging detectors and sensors; INFORMATION; Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques; INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; MEASURING INSTRUMENTS; Microwave theory and techniques; Nuclear physics; NUMERICAL DATA; Optical elements, devices, and systems; Optics; Optoelectronic devices; Photodetectors (including infrared and CCD detectors); PHYSICAL PROPERTIES; Physics; Plasma chemistry; Plasma measurements; RADIATION DETECTION; Radiation detectors; RADIATION DETECTORS 440101 > Radiation Instrumentation > General Detectors or Monitors & Radiometric Instruments; Radiation detectors, dosimeters; RESPONSE FUNCTIONS; SEMICONDUCTOR DETECTORS; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; SENSITIVITY; Solid-state detectors; X-RAY DETECTION; X-ray detectors; X-ray lasers; CVD; Thin films; Fabrication; Radiation detectors; Diamonds; Alpha particles; X radiation; Laser beams; Pulses
• ISSN: 0018-9499; 1558-1578
• DOI: 10.1109/23.322833

Diamond films produced by microwave plasma enhanced chemical vapor deposition (CVD) technique have been used to fabricate radiation detectors. The polycrystalline diamond films have a measured resistivity of 10/sup 12/ /spl Omega/.cm, a carrier mobility of 280 cm/sup 2//V.s and a carrier lifetime of about 530 ps. The detector response to laser pulses (/spl lambda/=355, 532 and 1064 nm), X-ray flux (15-50 keV) and alpha particles (/sup 241/Am, 5.49 MeV) has been investigated. The response speed of the detector is in the 100 ps range. A sensitivity of about 3/spl times/10/sup -10/A/V.(Gy/s) was measured under a 50 keV X-ray flux. The detector current response to X-ray flux is almost linear. It is also shown that CVD diamond detectors can be used for alpha particle counting.< >