Experimental evidence for excitonic mechanism of defect generation in high-purity silica

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Bibliographic Details
Published inPhysical review letters Vol. 67; no. 18; p. 2517
Main Authors Tsai, TE, Griscom, DL
Format Journal Article
LanguageEnglish
Published United States 28.10.1991
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ISSN:1079-7114
DOI:10.1103/PhysRevLett.67.2517