Fast Electron Ionization Effect in Multigap Pseudospark Discharge Under Nanosecond Pulsed Voltages

In this paper, research studies on the breakdown progresses of multigap pseudospark discharge under nanosecond pulsed voltages are reported. The experimental results show great differences from dc voltages. The discharge mechanism of the pseudospark under nanosecond pulsed voltages has been successf...

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Bibliographic Details
Published inIEEE transactions on plasma science Vol. 43; no. 11; pp. 3921 - 3924
Main Authors Zhang, Jia, Zhao, Junping, Zhang, Qiaogen
Format Journal Article
LanguageEnglish
Published New York IEEE 01.11.2015
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Summary:In this paper, research studies on the breakdown progresses of multigap pseudospark discharge under nanosecond pulsed voltages are reported. The experimental results show great differences from dc voltages. The discharge mechanism of the pseudospark under nanosecond pulsed voltages has been successfully explained by the fast electron ionization effect. In each gap, collision ionizations caused by the fast electron start step by step, and development progresses are almost the same and approximately simultaneous until the main gap breaks down.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
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ISSN:0093-3813
1939-9375
DOI:10.1109/TPS.2015.2411693