3D mapping of residual stresses in growing grains of partially recrystallized Gum Metal

• Published in: Materials research letters Vol. 11; no. 11; pp. 942 - 948
• Main Authors: Lindkvist, Adam, Liu, Wenjun, Jensen, Dorte Juul, Zhang, Yubin
• Format: Journal Article
• Language: English
• Published: New York Taylor & Francis Ltd 02.11.2023; Taylor & Francis Group
• Subjects: 3D reconstruction; Crystallography; Deformation; Ductility; Elastic deformation; Elastic properties; Grain boundaries; Grain size; Grains; Gum metal; Mechanical engineering; Microscopy; Plastic deformation; Recrystallization; Residual stress; residual stresses; Sensors; Synchrotron radiation; Synchrotrons; Titanium; Titanium alloys; X ray microscopy; X-rays; Yield stress
• ISSN: 2166-3831; 2166-3831
• DOI: 10.1080/21663831.2023.2267094

The crystallographic orientations and residual stresses within recrystallizing grains in partially recrystallized β titanium—Gum Metal—were examined non-destructively in 3D using synchrotron Differential Aperture X-ray Microscopy. Contrary to common assumptions, significant local stresses and stress variations are observed within the recrystallizing grains. The results reveal that the development of these local residual stresses depends on the plastic deformation mode and material’s elastic constants, rather than grain properties such as size and orientation, or even the material’s yield stress. This work provides insights valuable for the design of advanced materials with heterogeneous microstructures.