Simulation of emission characteristics and optimisation of waveguiding parameters of a ridge semiconductor heterolaser to maximise the emission brightness

The results of simulation of the emission characteristics of high-power ridge lasers at pump currents much higher than the threshold current are presented. The nonlinear interaction of carriers and the field in the laser cavity taking into account their distributions along the cavity axis and the in...

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Bibliographic Details
Published inQuantum electronics (Woodbury, N.Y.) Vol. 36; no. 11; pp. 1058 - 1064
Main Authors Plisyuk, S A, Batrak, D V, Drakin, A E, Bogatov, Alexandr P
Format Journal Article
LanguageEnglish
Russian
Published Woodbury, NY IOP Publishing 30.11.2006
American Institute of Physics
Subjects
BRIGHTNESS
CARRIERS
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
CURRENTS
DISTRIBUTION
EFFICIENCY
ELECTRIC CURRENTS
EMISSION
HEATING
LASER CAVITIES
LASERS
NONLINEAR PROBLEMS
OPTICAL PROPERTIES
OPTIMIZATION
PHYSICAL PROPERTIES
REFRACTIVE INDEX
SEMICONDUCTOR DEVICES
SEMICONDUCTOR LASERS
SIMULATION
SOLID STATE LASERS
THRESHOLD CURRENT
WAVEGUIDES
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Summary:The results of simulation of the emission characteristics of high-power ridge lasers at pump currents much higher than the threshold current are presented. The nonlinear interaction of carriers and the field in the laser cavity taking into account their distributions along the cavity axis and the influence of the inhomogeneous heating of the laser on the waveguiding effect are considered in the simulation. The dependence of the maximum single-mode output power on the ridge width W and the built-in {delta}n{sub b} of the refractive index is studied. It is shown that a set of values of W and {delta}n{sub b} can be divided into four regions, each of which is characterised by its own type of the upset of lateral-single-mode operation. The calculated values of the threshold current, differential efficiency and the far-field intensity distribution of laser emission agree well with the experiment. (lasers)
ISSN:1063-7818
1468-4799
DOI:10.1070/QE2006v036n11ABEH013366