Resonant TM transmission through metallized variable depth grating

Symmetrical dielectric/metal/dielectric structure based on variable depth grating was fabricated and characterized. Plasmon-mediated resonant TM transmission across optically thick aluminium layer is measured for a continuous and large set of undulation depth, the existence of optimized depth is exp...

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Published inJournal of physics. Conference series Vol. 1461; no. 1; pp. 12180 - 12183
Main Authors Ushkov, Andrei A., Verrier, Isabelle, Kampfe, Thomas, Shcherbakov, Alexey A., Jourlin, Yves
Format Journal Article
LanguageEnglish
Published Bristol IOP Publishing 01.03.2020
Subjects
Aluminum
Metallizing
Physics
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Summary:Symmetrical dielectric/metal/dielectric structure based on variable depth grating was fabricated and characterized. Plasmon-mediated resonant TM transmission across optically thick aluminium layer is measured for a continuous and large set of undulation depth, the existence of optimized depth is experimentally demonstrated alongside other plasmonic and interference features. The correspondence with rigorous GSMCC numerical simulations is confirmed.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/1461/1/012180