Application of Doehlert matrix to the study of flow injection procedure for selenium (IV) determination
A method for the rapid determination of selenium is reported. It is based on the injection of selenium sample into a stream of KI and subsequent measurement of the increase of the absorption at 290nm due to the formation of I3−. A Doehlert matrix was applied for the determination of the optimal work...
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Published in | Talanta (Oxford) Vol. 63; no. 4; pp. 1089 - 1094 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
Amsterdam
Elsevier B.V
08.07.2004
Oxford Elsevier |
Subjects | |
Online Access | Get full text |
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Summary: | A method for the rapid determination of selenium is reported. It is based on the injection of selenium sample into a stream of KI and subsequent measurement of the increase of the absorption at 290nm due to the formation of I3−. A Doehlert matrix was applied for the determination of the optimal working conditions. With the developed method, a linear calibration curve from 1 to 10ppm was obtained. For the analysis of semiconducting thin layers of CuInSe2 (CIS), a cationic resin was added to the sample solution in order to eliminate the effect of copper and indium on the absorbance values. With the developed procedure a sample throughput of 36 samples per hour and a relative standard deviation 1.1% was achieved. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 0039-9140 1873-3573 |
DOI: | 10.1016/j.talanta.2004.01.011 |