Application of Doehlert matrix to the study of flow injection procedure for selenium (IV) determination

A method for the rapid determination of selenium is reported. It is based on the injection of selenium sample into a stream of KI and subsequent measurement of the increase of the absorption at 290nm due to the formation of I3−. A Doehlert matrix was applied for the determination of the optimal work...

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Bibliographic Details
Published inTalanta (Oxford) Vol. 63; no. 4; pp. 1089 - 1094
Main Authors Hellal, F., Dachraoui, M.
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 08.07.2004
Oxford Elsevier
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Summary:A method for the rapid determination of selenium is reported. It is based on the injection of selenium sample into a stream of KI and subsequent measurement of the increase of the absorption at 290nm due to the formation of I3−. A Doehlert matrix was applied for the determination of the optimal working conditions. With the developed method, a linear calibration curve from 1 to 10ppm was obtained. For the analysis of semiconducting thin layers of CuInSe2 (CIS), a cationic resin was added to the sample solution in order to eliminate the effect of copper and indium on the absorbance values. With the developed procedure a sample throughput of 36 samples per hour and a relative standard deviation 1.1% was achieved.
Bibliography:ObjectType-Article-1
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content type line 23
ISSN:0039-9140
1873-3573
DOI:10.1016/j.talanta.2004.01.011