Wear-resistance comparison of carbon nanotubes and conventional silicon-probes for atomic force microscopy

In this paper, a comparison of the wear characteristics of carbon nanotube (CNT) probe and conventional silicon atomic force microscopy (AFM) probe in tapping mode by continuous scanning on a hard surface is reported. The results indicated that the conventional silicon probe wears greatly and its co...

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Bibliographic Details
Published inWear Vol. 258; no. 11; pp. 1836 - 1839
Main Authors Guo, Liqiu, Wang, Rui, Xu, Huaming, Liang, Ji
Format Journal Article
LanguageEnglish
Published Lausanne Elsevier B.V 01.06.2005
Amsterdam Elsevier Science
New York, NY
Subjects
Applied sciences
Atomic force microscopy (AFM)
Carbon nanotube
Exact sciences and technology
Friction, wear, lubrication
Machine components
Mechanical engineering. Machine design
Probe
Wear characteristics
Carbon nanotube
Atomic force microscopy (AFM)
Probe
Wear characteristics
Atomic force microscopy
Lifetime
Wear
Carbon nanotubes
Durability
Wear resistance
Silicon
Tribology
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Summary:In this paper, a comparison of the wear characteristics of carbon nanotube (CNT) probe and conventional silicon atomic force microscopy (AFM) probe in tapping mode by continuous scanning on a hard surface is reported. The results indicated that the conventional silicon probe wears greatly and its corresponding image resolution decreases greatly, and the scanned sample also wore, while the CNT probe and scanned sample showed no wear and the resolution remained unchanged. Therefore, the CNT probe has longer lifetime than the conventional probe and hence it is an ideal probe for AFM.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0043-1648
1873-2577
DOI:10.1016/j.wear.2004.12.046