Bispectral analysis and model validation of texture images

• Published in: IEEE transactions on image processing Vol. 4; no. 7; pp. 996 - 1009
• Main Authors: Hall, T.E., Giannakis, G.B.
• Format: Journal Article
• Language: English
• Published: New York, NY IEEE 01.07.1995; Institute of Electrical and Electronics Engineers
• Subjects: Analytical models; Applied sciences; Exact sciences and technology; Gaussian processes; Image analysis; Image processing; Image texture analysis; Information, signal and communications theory; Linearity; Parameter estimation; Performance analysis; Phase estimation; Signal processing; Statistical analysis; Telecommunications and information theory; Testing; Random field; ARMA model; Parameter estimation; Experimental result; Image processing; Spectrum analysis; Statistical methods; Digital image; Markov model; Textures

Statistical approaches to texture analysis and synthesis have largely relied upon random models that characterize the 2-D process in terms of its first- and second-order statistics, and therefore cannot completely capture phase properties of random fields that are non-Gaussian and/or asymmetric. In...