Determination of the Mass Absorption Coefficient in Two-Layer Cr/Co Thin Film Systems by the X-Ray Fluorescence Method

XRF procedure to determine the mass absorption coefficient in Cr/Co two-layer systems has been proposed. The procedure uses easy-to-make thin-fi lm layers of sputtered chromium on a polymer fi lm substrate. Correction coefficients have been calculated that take into account the absorption of primary...

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Bibliographic Details
Published inJournal of applied spectroscopy Vol. 86; no. 6; pp. 1048 - 1052
Main Authors Cherniaeva, E. A., Knyazeva, A. A., Zimina, E. O., Belyakova, I. S., Mashin, N. I.
Format Journal Article
LanguageEnglish
Published New York Springer US 2020
Springer
Springer Nature B.V
Subjects
Absorptivity
Analysis
Analytical Chemistry
Atomic/Molecular Structure and Spectra
Chromium
Dielectric films
Electrical conductivity
Fluorescence
Methods
Physics
Physics and Astronomy
Substrates
Thin films
X ray tubes
X-ray fluorescence
X-ray spectroscopy
X-ray fluorescence analysis
correction coefficient
mass absorption coefficient
polymer fi lm substrate
thin two-layer fi lm
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Summary:XRF procedure to determine the mass absorption coefficient in Cr/Co two-layer systems has been proposed. The procedure uses easy-to-make thin-fi lm layers of sputtered chromium on a polymer fi lm substrate. Correction coefficients have been calculated that take into account the absorption of primary radiation of the X-ray tube and the absorption intensities of the analytical lines of a lower layer element in an upper layer.
ISSN:0021-9037
1573-8647
DOI:10.1007/s10812-020-00938-y