Determination of the Mass Absorption Coefficient in Two-Layer Cr/Co Thin Film Systems by the X-Ray Fluorescence Method

XRF procedure to determine the mass absorption coefficient in Cr/Co two-layer systems has been proposed. The procedure uses easy-to-make thin-fi lm layers of sputtered chromium on a polymer fi lm substrate. Correction coefficients have been calculated that take into account the absorption of primary...

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Bibliographic Details
Published inJournal of applied spectroscopy Vol. 86; no. 6; pp. 1048 - 1052
Main Authors Cherniaeva, E. A., Knyazeva, A. A., Zimina, E. O., Belyakova, I. S., Mashin, N. I.
Format Journal Article
LanguageEnglish
Published New York Springer US 2020
Springer
Springer Nature B.V
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Summary:XRF procedure to determine the mass absorption coefficient in Cr/Co two-layer systems has been proposed. The procedure uses easy-to-make thin-fi lm layers of sputtered chromium on a polymer fi lm substrate. Correction coefficients have been calculated that take into account the absorption of primary radiation of the X-ray tube and the absorption intensities of the analytical lines of a lower layer element in an upper layer.
ISSN:0021-9037
1573-8647
DOI:10.1007/s10812-020-00938-y