A relocated technique of atomic force microscopy (AFM) samples and its application in molecular biology

• Published in: Ultramicroscopy Vol. 92; no. 3; pp. 201 - 207
• Main Authors: Wu, Aiguo, Li, Zhuang, Yu, Lihua, Wang, Hongda, Wang, Erkang
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 01.08.2002; Elsevier Science
• Subjects: AFM; Aluminum Silicates; Atomic force microscopes; DNA; DNA - ultrastructure; Exact sciences and technology; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; Microscopy, Atomic Force - instrumentation; Microscopy, Atomic Force - methods; Molecular Biology - methods; Physics; Plasmids - ultrastructure; Sample locator system; Scanning probe microscopes, components and techniques; Tapping mode and contact mode; 024 Subject index terms: 018; AFM; Sample locator system; Tapping mode and contact mode; DNA; 018; Atomic force microscopy; Instrumentation; Locator; Molecular biology; Experimental study
• ISSN: 0304-3991; 1879-2723
• DOI: 10.1016/S0304-3991(02)00133-X

A kind of simple atomic force microscopy (AFM) relocated technique, which takes advantage of homemade sample locator system, is used for investigating repeatedly imaging of some specific species on the whole substrate (over 1×1 cm 2) with resolution about 400 nm. As applications of this sample locator system, single extended DNA molecules and plasmid DNA network are shown in different AFM operational modes: tapping mode and contact mode with different tips after the substrates have been moved.