Preparation and characterization of nanostructured copper bismuth diselenide thin films from a chemical route

• Published in: Bulletin of materials science Vol. 33; no. 6; pp. 663 - 670
• Main Authors: BARI, R H, PATIL, L A
• Format: Journal Article
• Language: English
• Published: India Springer-Verlag 01.12.2010; Springer Nature B.V
• Subjects: Absorption spectroscopy; Bismuth; Chemistry and Materials Science; Composition; Copper; DEPOSITION; Electrical conductivity; Electrical resistivity; Energy; Energy dispersive X ray analysis; Engineering; Glass substrates; Materials Science; MICA; Microscopy; MICROSTRUCTURES; Morphology; Nitrates; Optical properties; Resistivity; Scanning electron microscopy; Selenium; Silicon nitride; Sodium; Spectrum analysis; Substrates; THIN FILMS; X ray analysis; X RAYS; Copper bismuth diselenide; chemical bath deposition; deposition parameters; thin films
• ISSN: 0250-4707; 0973-7669
• DOI: 10.1007/s12034-011-0147-8

Thin films of copper bismuth diselenide were prepared by chemical bath deposition technique ontoglass substrate below 60°C. The deposition parameters such as time, temperature of deposition and pH of the solution, were optimized. The set of films having different elemental compositions was prepared by varying Cu/Bi ratio from 0·13–1·74. Studies on structure, composition, morphology, optical absorption and electrical conductivity of the films were carried out and discussed. Characterization includes X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), energy dispersive X-ray analysis (EDAX), absorption spectroscopy, and electrical conductivity. The results are discussed and interpreted.