Differential quantitative analysis of background structure in energy-filtered convergent-beam electron diffraction patterns

• Published in: Journal of applied crystallography Vol. 43; no. 2; pp. 280 - 284
• Main Authors: Nakashima, Philip N. H., Muddle, Barrington C.
• Format: Journal Article
• Language: English
• Published: 5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01.04.2010; Blackwell Publishing Ltd
• Subjects: background measurement; Beamforming; CBED; Diffraction; Electrons; Measurement techniques; QCBED; quantitative convergent-beam electron diffraction
• ISSN: 1600-5767; 0021-8898; 1600-5767
• DOI: 10.1107/S0021889810000749

Measurements of electronic structure in solids by quantitative convergent‐beam electron diffraction (QCBED) will not reach their ultimate accuracy or precision until the contribution of the background to the reflections in energy‐filtered CBED patterns is fully accounted for. Apart from the well known diffuse background that arises from thermal diffuse scattering of electrons, there is a component that has a much higher angular frequency. The present work reports experimental evidence that this component mimics the angular distribution of the elastically scattered electrons within each reflection. A differential approach to QCBED is suggested as a means of quantitatively accounting for the background in energy‐filtered CBED data.