Using waveguide scattering of laser radiation for determining the autocorrelation function of statistical surface roughness within a wide range of changes of the roughness correlation interval

An electrodynamic problem of laser radiation scattering in an integrated-optical waveguide containing small statistical irregularities (interface roughness and irregularities of the refractive indices of the waveguide-forming media) is considered. The possibility of using the waveguide scattering of...

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Bibliographic Details
Published inQuantum electronics (Woodbury, N.Y.) Vol. 32; no. 4; pp. 357 - 361
Main Author Egorov, Alexander A
Format Journal Article
LanguageEnglish
Russian
Published Woodbury, NY IOP Publishing 30.04.2002
American Institute of Physics
Subjects
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
COMPUTERIZED SIMULATION
CORRELATION FUNCTIONS
DIAGRAMS
ELECTROMAGNETIC RADIATION
FUNCTIONS
INFORMATION
LASER RADIATION
NOISE
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
RADIATIONS
REFRACTIVE INDEX
ROUGHNESS
SCATTERING
SIMULATION
SUBSTRATES
SURFACE PROPERTIES
SURFACES
WAVEGUIDES
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Summary:An electrodynamic problem of laser radiation scattering in an integrated-optical waveguide containing small statistical irregularities (interface roughness and irregularities of the refractive indices of the waveguide-forming media) is considered. The possibility of using the waveguide scattering of laser radiation for extracting the information on the statistical properties of irregularities from noisy data of the scattering diagram in a far-field zone is shown. An algorithm for reconstructing the autocorrelation function of irregularities for the correlation interval changing within a wide range is described. The possibility of restoring a given Gaussian autocorrelation function that describes statistical irregularities of the waveguide substrate surface for a correlation interval changing between 10 nm and 10 {mu}m and a high-level additive white real noise is shown by computer simulation. (laser applications and other topics in quantum electronics)
ISSN:1063-7818
1468-4799
DOI:10.1070/QE2002v032n04ABEH002198