Optimized Sample Preparation for Glass Fragments by Scanning Electron Microscopy-Energy Dispersive X-ray Spectrometry

• Published in: Analytical letters Vol. 49; no. 12; pp. 1884 - 1895
• Main Authors: Michalska, Aleksandra, Zadora, Grzegorz, Martyna, Agnieszka
• Format: Journal Article
• Language: English
• Published: Taylor & Francis 12.08.2016
• Subjects: Dispersion; Flats; Forensic engineering; Forensic science; Fragments; Glass; glass fragments; Scanning electron microscopy; scanning electron microscopy-energy dispersive X-ray spectrometer; Spectrometry; X-rays

Quantitative analysis by scanning electron microscopy-energy dispersive X-ray spectrometer (SEM-EDX) requires a flat and smooth sample surface. To fulfill these requirements, an embedding procedure is generally used for sample preparation. This approach is impractical for small glass fragments, whic...