Optimized Sample Preparation for Glass Fragments by Scanning Electron Microscopy-Energy Dispersive X-ray Spectrometry

Quantitative analysis by scanning electron microscopy-energy dispersive X-ray spectrometer (SEM-EDX) requires a flat and smooth sample surface. To fulfill these requirements, an embedding procedure is generally used for sample preparation. This approach is impractical for small glass fragments, whic...

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Bibliographic Details
Published inAnalytical letters Vol. 49; no. 12; pp. 1884 - 1895
Main Authors Michalska, Aleksandra, Zadora, Grzegorz, Martyna, Agnieszka
Format Journal Article
LanguageEnglish
Published Taylor & Francis 12.08.2016
Subjects
Dispersion
Flats
Forensic engineering
Forensic science
Fragments
Glass
glass fragments
Scanning electron microscopy
scanning electron microscopy-energy dispersive X-ray spectrometer
Spectrometry
X-rays
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Summary:Quantitative analysis by scanning electron microscopy-energy dispersive X-ray spectrometer (SEM-EDX) requires a flat and smooth sample surface. To fulfill these requirements, an embedding procedure is generally used for sample preparation. This approach is impractical for small glass fragments, which are frequently the subject of forensic examination. The authors report the use of optical microscopy for selecting glass fragments that are smooth and flat as possible and directly placing them on a scanning electron microscopy stub. The results using two SEM-EDXs were compared for embedded and nonembedded glass standards. No significant differences in accuracy, precision, reproducibility, and false answer rates were observed using likelihood ratio models suggesting that the reported method of sample preparation is suitable for forensic analysis.
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content type line 23
ISSN:0003-2719
1532-236X
DOI:10.1080/00032719.2015.1126598