Efficient Simulation Model for Amorphous In-Ga-Zn-O Thin-Film Transistors

A computationally efficient simulation model for the drain current characteristics of long-channel amorphous In-Ga-Zn-O (a-IGZO) thin-film transistors (TFTs) is developed. This model uses numerical solutions of the one-dimensional Poisson equation to significantly reduce the calculation time compare...

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Bibliographic Details
Published inJournal of display technology Vol. 10; no. 2; pp. 101 - 106
Main Authors Tsuji, Hiroshi, Nakata, Mitsuru, Sato, Hiroto, Nakajima, Yoshiki, Fujisaki, Yoshihide, Takei, Tatsuya, Fujikake, Hideo, Yamamoto, Toshihiro, Shimidzu, Naoki
Format Journal Article
LanguageEnglish
Published New York IEEE 01.02.2014
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
a-IGZO
Computational modeling
Computer simulation
device simulation
Drains
Electron traps
Insulators
Logic gates
Mathematical model
Mathematical models
Poisson equation
semiconductor device modeling
Semiconductor devices
Simulation
Thin film transistors
thin-film transistor
Threshold voltage
Transistors
Voltage measurement
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Summary:A computationally efficient simulation model for the drain current characteristics of long-channel amorphous In-Ga-Zn-O (a-IGZO) thin-film transistors (TFTs) is developed. This model uses numerical solutions of the one-dimensional Poisson equation to significantly reduce the calculation time compared to a widely used two-dimensional approach. Moreover, for accurate simulation, the model takes into account the influence of trap states in the band gap, which makes it possible to reproduce the gradual increase of the drain current in the subthreshold region. The model also includes both drift and diffusion components of the drain current and so can describe the drain current in all regions of device operation, i.e., the subthreshold, linear, and saturation regions, by using a unified current equation without introducing the threshold voltage as an input parameter. Calculations using the model provide results that are in good agreement with the measured drain current characteristics of a-IGZO TFTs over a wide range of gate and drain voltages. The presented model is expected to enable faster and accurate characteristic analysis and structure design for a-IGZO TFTs.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
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ISSN:1551-319X
1558-9323
DOI:10.1109/JDT.2013.2294852