Operation of poly bipolar transistors near liquid-helium temperatures (9 K)
Operation of bipolar transistors with poly emitters with current gain beta >25 at 77 K and beta >3 at 9 K has been demonstrated. In the temperature range of 300 K to 9 K, the plot of beta vs. temperature (T) exhibits a minimum at T equal to 40 K: decreasing monotonically from 300 K to 40 K, re...
Saved in:
Published in | IEEE electron device letters Vol. 9; no. 4; pp. 177 - 179 |
---|---|
Main Authors | , |
Format | Journal Article |
Language | English |
Published |
New York, NY
IEEE
01.04.1988
Institute of Electrical and Electronics Engineers |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | Operation of bipolar transistors with poly emitters with current gain beta >25 at 77 K and beta >3 at 9 K has been demonstrated. In the temperature range of 300 K to 9 K, the plot of beta vs. temperature (T) exhibits a minimum at T equal to 40 K: decreasing monotonically from 300 K to 40 K, remaining unchanged between 40 K to 30 K, and increasing slightly from 30 K to 9 K. This behavior is attributed to freezeout of acceptor impurities in the base for T<40 K.< > |
---|---|
AbstractList | Operation of bipolar transistors with poly emitters with current gain beta >25 at 77 K and beta >3 at 9 K has been demonstrated. In the temperature range of 300 K to 9 K, the plot of beta vs. temperature (T) exhibits a minimum at T equal to 40 K: decreasing monotonically from 300 K to 40 K, remaining unchanged between 40 K to 30 K, and increasing slightly from 30 K to 9 K. This behavior is attributed to freezeout of acceptor impurities in the base for T<40 K.< > Operation of bipolar transistors with poly emitters with current gain beta > 25 at 77 K and beta > 3 at 9 K has been demonstrated. In the temperature range of 300 K to 9 K, the plot of beta vs. temperature ( < e1 > T < /e1 > ) exhibits a minimum at < e1 > T < /e1 > equal to 40 K: decreasing monotonically from 300 K to 40 K, remaining unchanged between 40 K to 30 K, and increasing slightly from 30 K to 9 K. This behavior is attributed to freezeout of acceptor impurities in the base for < e1 > T < /e1 > < 40 K Operation of bipolar transistors with poly emitters with current gain beta greater than 25 at 77 K and beta greater than 3 at 9 K has been demonstrated. In the temperature range of 300 to 9 K, the plot of beta versus temperature T exhibits a minimum at T equal to 40 K: decreasing monotonically from 300 to 40 K, remaining unchanged between 40 to 30 K, and increasing slightly from 30 to 9 K. This unique behavior is attributed to freezeout or acceptor impurities in the base for T less than 40 K. (Author) Operation of bipolar transistors with poly emitters with current gain beta > 25 at 77 K and beta > 3 at 9 K has been demonstrated. In the temperature range of 300 to 9 K, the plot of beta versus temperature T exhibits a minimum at T equal to 40 K: decreasing monotonically from 300 to 40 K, remaining unchanged between 40 to 30 K, and increasing slightly from 30 to 9 K. This unique behavior is attributed to freezeout or acceptor impurities in the base for T < 40 K. |
Author | Kapoor, A.K. Jayadev, T.S. |
Author_xml | – sequence: 1 givenname: A.K. surname: Kapoor fullname: Kapoor, A.K. organization: Fairchild Res. Center, Palo Alto, CA, USA – sequence: 2 givenname: T.S. surname: Jayadev fullname: Jayadev, T.S. |
BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=6998721$$DView record in Pascal Francis |
BookMark | eNqN0TtPwzAQB3ALFYm2wMrqASEYUvx-jKjipVbqAnPkJLYwSuLWToZ-e1JaAVsZrJN8v_sPdxMwakNrAbjEaIYx0vecz4TCJ2CMOVcZ4oKOwBhJhjOKkTgDk5Q-EcKMSTYGi9XaRtP50MLg4DrUW1j4oZgIu2ja5FMXYoKtHT5qv-l9lX3Y2vcN7GzzPdpHm-Cthou7c3DqTJ3sxaFOwfvT49v8JVuunl_nD8uspBp1makcYoZjRpQTCqkCF8oIo9jwJEe80rYgtCJaFIpUzjkrBSYUcalwaUpJp-Bmn7uOYdPb1OWNT6Wta9Pa0KecaIQUJ-o4VJwizfFxyLQkWtJ_QvwHljGkFK3L19E3Jm5zjPLdmXLO8-FMA7w-JJpUmtoNSy99-tFCayXJjl3tmbfW_naHgC8IZJkI |
CODEN | EDLEDZ |
CitedBy_id | crossref_primary_10_1109_16_544418 crossref_primary_10_1109_16_59915 crossref_primary_10_1109_16_30962 crossref_primary_10_1109_LED_2023_3309700 |
Cites_doi | 10.1109/T-ED.1968.16506 10.1109/IEDM.1978.189454 10.1109/T-ED.1981.20372 10.1016/0038-1101(77)90054-5 10.1109/T-ED.1982.21043 10.1109/T-ED.1987.22895 10.1109/T-ED.1987.22896 10.1109/T-ED.1980.19899 10.1103/PhysRev.96.28 |
ContentType | Journal Article |
Copyright | 1989 INIST-CNRS |
Copyright_xml | – notice: 1989 INIST-CNRS |
DBID | IQODW AAYXX CITATION 7SP 8FD L7M H8D 7U5 |
DOI | 10.1109/55.681 |
DatabaseName | Pascal-Francis CrossRef Electronics & Communications Abstracts Technology Research Database Advanced Technologies Database with Aerospace Aerospace Database Solid State and Superconductivity Abstracts |
DatabaseTitle | CrossRef Technology Research Database Advanced Technologies Database with Aerospace Electronics & Communications Abstracts Aerospace Database Solid State and Superconductivity Abstracts |
DatabaseTitleList | Technology Research Database Technology Research Database Technology Research Database Technology Research Database |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Applied Sciences |
EISSN | 1558-0563 |
EndPage | 179 |
ExternalDocumentID | 10_1109_55_681 6998721 681 |
Genre | orig-research |
GroupedDBID | -~X .DC 0R~ 29I 4.4 5GY 5VS 6IK 97E AAJGR AASAJ ABQJQ ABVLG ACGFO ACIWK ACNCT AENEX AETIX AFFNX AI. AIBXA AKJIK ALLEH ALMA_UNASSIGNED_HOLDINGS ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD HZ~ IBMZZ ICLAB IFIPE IFJZH IPLJI JAVBF LAI M43 O9- OCL P2P RIA RIE RIG RNS TAE TN5 TWZ VH1 XFK 08R IQODW AAYXX CITATION 7SP 8FD L7M H8D 7U5 |
ID | FETCH-LOGICAL-c390t-adf04a51428f6808b1b8a6a846a87505d9eb23d296b82dfffe7612305781cac73 |
IEDL.DBID | RIE |
ISSN | 0741-3106 |
IngestDate | Fri Aug 16 11:22:37 EDT 2024 Fri Aug 16 00:47:34 EDT 2024 Fri Aug 16 21:27:00 EDT 2024 Fri Aug 16 21:26:54 EDT 2024 Fri Aug 23 01:29:22 EDT 2024 Sun Oct 29 17:09:22 EDT 2023 Wed Jun 26 19:25:35 EDT 2024 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 4 |
Keywords | Performance evaluation Transistor Silicon Voltage current curve Polycrystal Low temperature |
Language | English |
License | CC BY 4.0 |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c390t-adf04a51428f6808b1b8a6a846a87505d9eb23d296b82dfffe7612305781cac73 |
Notes | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
PQID | 24972913 |
PQPubID | 23500 |
PageCount | 3 |
ParticipantIDs | proquest_miscellaneous_24972913 pascalfrancis_primary_6998721 proquest_miscellaneous_28530951 proquest_miscellaneous_24972973 crossref_primary_10_1109_55_681 proquest_miscellaneous_29008528 ieee_primary_681 |
PublicationCentury | 1900 |
PublicationDate | 1988-04-01 |
PublicationDateYYYYMMDD | 1988-04-01 |
PublicationDate_xml | – month: 04 year: 1988 text: 1988-04-01 day: 01 |
PublicationDecade | 1980 |
PublicationPlace | New York, NY |
PublicationPlace_xml | – name: New York, NY |
PublicationTitle | IEEE electron device letters |
PublicationTitleAbbrev | LED |
PublicationYear | 1988 |
Publisher | IEEE Institute of Electrical and Electronics Engineers |
Publisher_xml | – name: IEEE – name: Institute of Electrical and Electronics Engineers |
References | kapoor (ref4) 1985 ref9 ref3 kauffman (ref7) 1968; 15 dillard (ref10) 1987; 34 ref6 ref11 wieder (ref8) 1978 kapoor (ref5) 1986 tang (ref2) 1980; 27 dumke (ref1) 1981; 28 |
References_xml | – volume: 15 start-page: 732 year: 1968 ident: ref7 article-title: the temperature dependence of ideal gain in double diffused silicon transistors publication-title: IEEE Transactions on Electron Devices doi: 10.1109/T-ED.1968.16506 contributor: fullname: kauffman – start-page: 460 year: 1978 ident: ref8 article-title: arsenic emitter effects publication-title: 1978 International Electron Devices Meeting doi: 10.1109/IEDM.1978.189454 contributor: fullname: wieder – volume: 28 start-page: 494 year: 1981 ident: ref1 article-title: the effect of base doping on the performance of si bipolar transistors at low temperatures publication-title: IEEE Transactions on Electron Devices doi: 10.1109/T-ED.1981.20372 contributor: fullname: dumke – start-page: 184 year: 1985 ident: ref4 article-title: A high-speed, high-density single poly technology for linear/digital applications publication-title: Proc IEEE Custom Integrated Circuits Conf contributor: fullname: kapoor – ident: ref11 doi: 10.1016/0038-1101(77)90054-5 – start-page: 33 year: 1986 ident: ref5 article-title: An improved single-poly bipolar technology for linear/digital applications publication-title: Proc IEEE Bipolar/Bi/CMOS Technology Meeting contributor: fullname: kapoor – ident: ref6 doi: 10.1109/T-ED.1982.21043 – ident: ref3 doi: 10.1109/T-ED.1987.22895 – volume: 34 start-page: 139 year: 1987 ident: ref10 article-title: the temperature dependence of the amplification factor of bipolar-junction transistors publication-title: IEEE Transactions on Electron Devices doi: 10.1109/T-ED.1987.22896 contributor: fullname: dillard – volume: 27 start-page: 563 year: 1980 ident: ref2 article-title: heavy doping effects in p-n-p bipolar transistors publication-title: IEEE Transactions on Electron Devices doi: 10.1109/T-ED.1980.19899 contributor: fullname: tang – ident: ref9 doi: 10.1103/PhysRev.96.28 |
SSID | ssj0014474 |
Score | 1.3828995 |
Snippet | Operation of bipolar transistors with poly emitters with current gain beta >25 at 77 K and beta >3 at 9 K has been demonstrated. In the temperature range of... Operation of bipolar transistors with poly emitters with current gain beta > 25 at 77 K and beta > 3 at 9 K has been demonstrated. In the temperature range of... Operation of bipolar transistors with poly emitters with current gain beta greater than 25 at 77 K and beta greater than 3 at 9 K has been demonstrated. In the... |
SourceID | proquest crossref pascalfrancis ieee |
SourceType | Aggregation Database Index Database Publisher |
StartPage | 177 |
SubjectTerms | Applied sciences Bipolar transistors Charge transfer devices Current measurement Doping Electronics Exact sciences and technology Impurities Packaging Photonic band gap Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Silicon Temperature distribution Temperature measurement Testing |
Title | Operation of poly bipolar transistors near liquid-helium temperatures (9 K) |
URI | https://ieeexplore.ieee.org/document/681 https://search.proquest.com/docview/24972913 https://search.proquest.com/docview/24972973 https://search.proquest.com/docview/28530951 https://search.proquest.com/docview/29008528 |
Volume | 9 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV07T8QwDI6ACQaOpzieGRhgaElfuWZEiBPiBCwg3VYlTSoqjvag7QC_Hjstx0sCtqqNqshOHH-x_ZmQQ1gkYBiDAWhA-k6ofelgqYBjvFBpLzaptEVhV9f84i68HEfj7r7D1sIYY2zymXHx0cbydZk2eFV2wrHGej5mflunNYsWhGHLtgynI9gUxrseQh4TJ1Hk8tj7cujYLiqYAykrEEPW9q_4YYrt-TLstWRHlaUlxLSSB7eplZu-fiNt_M_UV8hy52TS03ZVrJI5U6yRpU_Ug-tkdDM1rfJpmdFpOXmhKp8izqU1Hl-WPaSiBWwEOsmfmlw792aSN48Uyaw6JuaKHgk6Ot4gd8Pz27MLp2us4KSBYLUjdcZCGSHZWoatN5SnYskluCIS4AuLtAC8HWhfcBX7OssyM0CWFnDtYi-V6SDYJAtFWZgtQmWgjEi14X4YhSD6GPkEOVMY3eMqY31y8C75ZNryZyQWdzCRRFECYumTHopr9tW-2vuinI9vAA4BssJP35WVwG7AEIcsTNlUCYBJQAte8NeIwW8jwINBx_OXEQI9VT_e_jn1HbLoCTA-NrdnlyzUz43ZA7elVvt2zb4BmGrtTw |
link.rule.ids | 315,786,790,802,27955,27956,55107 |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV07T8QwDI4QDMDAG3E8MzDA0CN9pc2IEOjgeCwgsVVJk4oTR3vQdoBfj52W4yUdbFUbVZGd2P4S-zMh-7BIwDD6EWhAek6gPelgqYBj3EBpNzaptEVhV9e8dxdc3If37XmHrYUxxtjkM9PFR3uXr4u0xqOyI4411jPg41nUVGqN7wuCoOFbBv8IVoXxtouQy8RRGHZ57H5zO7aPCmZByhIEkTUdLH4ZY-thzhYbuqPSEhNiYsljt65UN337Qdv4n8kvkYU2zKTHzbpYJlMmXyHzX8gHV0n_ZmQa9dMio6Ni-ErVYIRIl1bowCx_SElz2Ap0OHiuB9p5MMNB_USRzqrlYi7pgaD9wzVyd3Z6e9Jz2tYKTuoLVjlSZyyQIdKtZdh8Q7kqllxCMCIBwLBQC0DcvvYEV7GnsywzEfK0QHAXu6lMI3-dTOdFbjYIlb4yItWGe0EYgOhjZBTkTOH9HlcZ65C9D8kno4ZBI7HIg4kkDBMQS4csorjGX-2rnW_K-fwG8BBAK_z0Q1kJ7Ae85JC5KeoyATgJeMH1_xoRTRoBMQyGnhNGCIxVvXjz99T3yGzv9uoyuTy_7m-ROVeAKbKZPttkunqpzQ4EMZXatev3HTXM8KM |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Operation+of+poly+bipolar+transistors+near+liquid-helium+temperatures+%289+K%29&rft.jtitle=IEEE+electron+device+letters&rft.au=KAPOOR%2C+ASHOKK&rft.au=JAYADEV%2C+TUMKURS&rft.date=1988-04-01&rft.issn=0741-3106&rft.volume=9&rft.spage=177&rft.epage=179&rft_id=info:doi/10.1109%2F55.681&rft.externalDBID=NO_FULL_TEXT |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0741-3106&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0741-3106&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0741-3106&client=summon |