Single-particle-diagnosis approach: An efficient strategy for discovering new nitride phosphors

Discovery of novel phosphors is extremely important to target the ever change of the solid state lighting technology. In this paper, we present a high-speed way to discover new phosphors, namely single- particle-diagnosis approach. This approach is based on investigating the crystal structure and lu...

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Bibliographic Details
Published inJournal of rare earths Vol. 36; no. 1; pp. 42 - 63
Main Authors Wang, Xiaojun, Takeda, Takashi, Hirosaki, Naoto, Funahashi, Shiro, Xie, Rong-Jun
Format Journal Article
LanguageEnglish
Published Elsevier B.V 2018
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Summary:Discovery of novel phosphors is extremely important to target the ever change of the solid state lighting technology. In this paper, we present a high-speed way to discover new phosphors, namely single- particle-diagnosis approach. This approach is based on investigating the crystal structure and lumines- cence of a tiny single crystal, without the necessity of the growth of large-size single crystals or the preparation of single phase powder samples. The concept of the approach and some new nitride phosphors explored by this approach are shown in this paper.
Bibliography:11-2788/TF
Discovery of novel phosphors is extremely important to target the ever change of the solid state lighting technology. In this paper, we present a high-speed way to discover new phosphors, namely single- particle-diagnosis approach. This approach is based on investigating the crystal structure and lumines- cence of a tiny single crystal, without the necessity of the growth of large-size single crystals or the preparation of single phase powder samples. The concept of the approach and some new nitride phosphors explored by this approach are shown in this paper.
Solid state lightingsPhosphorsLuminescenceCrystal structureSingle-particle-diagnosis approach
Xiaojun Wang a,. Takashi Takeda b Naoto Hirosaki b Shiro Funahashi b Rong-Jun Xie b, c( Jiangsu Key Laboratory of Advanced Laser Materials and Devices, School of Pflysics and Electronic Engineering, Jiangsu Normal University, Xuzhou 221116 China b Sialon Group, Environment and Energy Materials Division, National Institute for Materials Science (NIMS), Namiki, Tsukuba, lbaraki, 305-0044, Japan c College of Materials, Xiamen University, Xiamen 361005, China)
ISSN:1002-0721
2509-4963
DOI:10.1016/j.jre.2017.08.006