Lamellar crystallization of poly(trimethylene terephthalate)
The dependence of lamellar thickness on the melting temperature and crystallization temperature and the crystallization temperature dependence of the growth rate for poly(trimethylene terephthalate) (PTT) were examined with small-angle X-ray scattering (SAXS), wide angle X-ray diffraction (WAXD), di...
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Published in | Polymer journal Vol. 55; no. 7; pp. 775 - 783 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
London
Nature Publishing Group UK
01.07.2023
Nature Publishing Group |
Subjects | |
Online Access | Get full text |
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Summary: | The dependence of lamellar thickness on the melting temperature and crystallization temperature and the crystallization temperature dependence of the growth rate for poly(trimethylene terephthalate) (PTT) were examined with small-angle X-ray scattering (SAXS), wide angle X-ray diffraction (WAXD), differential scanning calorimetry (DSC) and optical microscopy. The melting temperature of the isothermally crystallized PTT lamellar stack structure was determined by X-ray measurements. The equilibrium melting temperature of PTT was determined to be 290.5 °C from the relationship between the melting temperature and the lamellar thickness. The relationships of supercooling to the lamellar thickness and the growth rate were analyzed. The excess thickness
δl
= 7.1 Å was obtained from the data provided above for the crystallization temperature,
T
c
= 173.7 °C. The temperature dependence of the lamellar thickness below
T
c
= 173.7 °C suggested crystallization through a mesophase. The temperature dependence of the growth rate was explained by secondary nucleation theory over a wide crystallization temperature range.
The melting temperature of the isothermally crystallized poly(trimethylene terephthalate) (PTT) lamellar stack structure was determined by X-ray measurements. The equilibrium melting temperature of PTT was determined to be 290.5 °C from the relationship between the melting temperature and the lamellar thickness. The temperature dependence of the lamellar thickness below
T
c
= 173.7 °C suggested crystallization through a mesophase. The temperature dependence of the growth rate was explained by secondary nucleation theory over a wide crystallization temperature range. |
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ISSN: | 0032-3896 1349-0540 |
DOI: | 10.1038/s41428-023-00777-6 |