Thermal Conductivity of Amorphous Indium--Gallium--Zinc Oxide Thin Films
We investigated the thermal conductivity of 200-nm-thick amorphous indium--gallium--zinc-oxide (a-IGZO) films. Films with a chemical composition of $\text{In}:\text{Ga}:\text{Zn}= 1:1:0.6$ were prepared by dc magnetron sputtering using an IGZO ceramic target and an Ar--O 2 sputtering gas. The carrie...
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Published in | Applied physics express Vol. 6; no. 2; pp. 021101 - 021101-3 |
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Main Authors | , , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
The Japan Society of Applied Physics
01.02.2013
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Online Access | Get full text |
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Summary: | We investigated the thermal conductivity of 200-nm-thick amorphous indium--gallium--zinc-oxide (a-IGZO) films. Films with a chemical composition of $\text{In}:\text{Ga}:\text{Zn}= 1:1:0.6$ were prepared by dc magnetron sputtering using an IGZO ceramic target and an Ar--O 2 sputtering gas. The carrier density of the films was systematically controlled from $10^{14}$ to ${>}10^{19}$ cm -3 by varying the O 2 flow ratio. Their Hall mobility was slightly higher than 10 cm 2 $\cdot$V -1 $\cdot$s -1 . Those films were sandwiched between 100-nm-thick Mo layers; their thermal diffusivity, measured by a pulsed light heating thermoreflectance technique, was ${\sim}5.4\times 10^{-7}$ m 2 $\cdot$s -1 and was almost independent of the carrier density. The average thermal conductivity was 1.4 W$\cdot$m -1 $\cdot$K -1 . |
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Bibliography: | Carrier density ($n$), Hall mobility ($\mu$) and resistivity ($\rho$) of a-IGZO films as functions of O 2 flow ratio during deposition. The applied magnetic field for the Hall measurement was changed from the dc method to the ac method when the resistivity exceeded 1 $\Omega$$\cdot$cm. Normalized transient temperatures of Mo/a-IGZO/Mo three-layered films, where the a-IGZO was deposited at the O 2 flow ratios of 0 and 2%, obtained by the pulsed light heating thermoreflectance technique. Thermal conductivities of a-IGZO and a-IZO films as a function of carrier density. A red dashed curve represents estimated thermal conductivity of a-IGZO film derived from sum of the contributions of phonons ($\lambda_{\text{ph}}$) and electrons ($\lambda_{\text{el}}$). $\lambda_{\text{el}}$ is calculated using Wiedemann--Franz law, where Lorenz number and Hall mobility are $2.45\times 10^{-8}$ W$\cdot$$\Omega$$\cdot$K -2 and 10.9 cm 2 $\cdot$V -1 $\cdot$s -1 , respectively. A blue dashed line shows $\lambda_{\text{ph}}$ of the IGZO films. Young's moduli of a-IGZO films with thicknesses of 200 and 1000 nm as a function of indentation depth. |
ISSN: | 1882-0778 1882-0786 |
DOI: | 10.7567/APEX.6.021101 |