Mimicking an Atomically Thin “Vacuum Spacer” to Measure the Hamaker Constant between Graphene Oxide and Silica

The Hamaker constant between graphene oxide and silica, which quantifies the strength of van der Waals forces is determined, by mimicking a “vacuum spacer” in an atomic force microscopyforce tudy. It is demonstrated that, a 2D spacer is expected to yield an accurately defined separation, owing to th...

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Published inAdvanced materials interfaces Vol. 4; no. 5; pp. np - n/a
Main Authors Chu, Liangyong, Korobko, Alexander V., Cao, Anping, Sachdeva, Sumit, Liu, Zhen, de Smet, Louis C. P. M., Sudhölter, Ernst J. R., Picken, Stephen J., Besseling, Nicolaas A. M.
Format Journal Article
LanguageEnglish
Published Weinheim John Wiley & Sons, Inc 09.03.2017
Subjects
2D materials
atomic force microscopy
Density
Graphene
graphene oxide
Hamaker constant
Oxides
Silicon dioxide
Spacers
Strength
vacuum spacers
Van der Waals forces
Yield strength
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Summary:The Hamaker constant between graphene oxide and silica, which quantifies the strength of van der Waals forces is determined, by mimicking a “vacuum spacer” in an atomic force microscopyforce tudy. It is demonstrated that, a 2D spacer is expected to yield an accurately defined separation, owing to the high atom density and strength in planar direction compared with other dimensional spacers.
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ISSN:2196-7350
2196-7350
DOI:10.1002/admi.201600495