Wide-range three-dimensional reciprocal-space mapping: a novel approach applied to organic monodomain thin films
An X‐ray method is presented to characterize thin films with unknown crystal structure with specific crystal orientations. The method maps large volumes of the reciprocal space by a series of pole‐figure measurements using a standard texture goniometer. The data can be used for lattice indexing and...
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Published in | Journal of applied crystallography Vol. 40; no. 3; pp. 580 - 582 |
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Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
5 Abbey Square, Chester, Cheshire CH1 2HU, England
Blackwell Publishing Ltd
01.06.2007
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Subjects | |
Online Access | Get full text |
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Summary: | An X‐ray method is presented to characterize thin films with unknown crystal structure with specific crystal orientations. The method maps large volumes of the reciprocal space by a series of pole‐figure measurements using a standard texture goniometer. The data can be used for lattice indexing and texture evaluation and in subsequent steps for a complete structural thin‐film characterization. The application of the method is demonstrated on an organic monodomain thin film consisting of uniaxially aligned crystallites. |
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Bibliography: | istex:090E47D558991AE6182A005569DBE83FA09FAE04 ArticleID:JCRFE5022 ark:/67375/WNG-K5L2SCNN-W ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 1600-5767 0021-8898 1600-5767 |
DOI: | 10.1107/S0021889807018407 |