Wide-range three-dimensional reciprocal-space mapping: a novel approach applied to organic monodomain thin films

An X‐ray method is presented to characterize thin films with unknown crystal structure with specific crystal orientations. The method maps large volumes of the reciprocal space by a series of pole‐figure measurements using a standard texture goniometer. The data can be used for lattice indexing and...

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Bibliographic Details
Published inJournal of applied crystallography Vol. 40; no. 3; pp. 580 - 582
Main Authors Lengyel, O., Haber, T., Werzer, O., Hardeman, W., De Leeuw, D. M., Wondergem, H. J., Resel, R.
Format Journal Article
LanguageEnglish
Published 5 Abbey Square, Chester, Cheshire CH1 2HU, England Blackwell Publishing Ltd 01.06.2007
Subjects
Crystal structure
Crystallography
monodomain thin films
reciprocal-space mapping
Research methodology
Thin films
Three dimensional imaging
X-rays
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Summary:An X‐ray method is presented to characterize thin films with unknown crystal structure with specific crystal orientations. The method maps large volumes of the reciprocal space by a series of pole‐figure measurements using a standard texture goniometer. The data can be used for lattice indexing and texture evaluation and in subsequent steps for a complete structural thin‐film characterization. The application of the method is demonstrated on an organic monodomain thin film consisting of uniaxially aligned crystallites.
Bibliography:istex:090E47D558991AE6182A005569DBE83FA09FAE04
ArticleID:JCRFE5022
ark:/67375/WNG-K5L2SCNN-W
ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:1600-5767
0021-8898
1600-5767
DOI:10.1107/S0021889807018407