The Relationship Between Confidence Intervals for Failure Probabilities and Life Time Quantiles
The failure probability of a product F ( t ), and the life time quantile t p are commonly used metrics in reliability applications. Confidence intervals are used to quantify the s -uncertainty of estimators of these two metrics. In practice, a set of pointwise confidence intervals for F ( t ), or th...
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Published in | IEEE transactions on reliability Vol. 57; no. 2; pp. 260 - 266 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.06.2008
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
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Summary: | The failure probability of a product F ( t ), and the life time quantile t p are commonly used metrics in reliability applications. Confidence intervals are used to quantify the s -uncertainty of estimators of these two metrics. In practice, a set of pointwise confidence intervals for F ( t ), or the quantiles t p are often plotted on one graph, which we refer to as pointwise ldquoconfidence bands.rdquo These confidence bands for F ( t ) or t p can be obtained through s -normal approximation, maximum likelihood, or other procedures. In this paper, we compare s -normal approximation to likelihood methods, and introduce a new procedure to get the confidence intervals for F ( t ) by inverting the pointwise confidence bands of the quantile t p function. We show why it is valid to interpret the set of pointwise confidence intervals for the quantile function as a set of pointwise confidence intervals for F ( t ), and vice-versa. Our results also indicate that the likelihood-based pointwise confidence bands have desirable statistical properties, beyond those that were known previously. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0018-9529 1558-1721 |
DOI: | 10.1109/TR.2008.920352 |