The Relationship Between Confidence Intervals for Failure Probabilities and Life Time Quantiles

The failure probability of a product F ( t ), and the life time quantile t p are commonly used metrics in reliability applications. Confidence intervals are used to quantify the s -uncertainty of estimators of these two metrics. In practice, a set of pointwise confidence intervals for F ( t ), or th...

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Bibliographic Details
Published inIEEE transactions on reliability Vol. 57; no. 2; pp. 260 - 266
Main Authors Yili Hong, Meeker, W.Q., Escobar, L.A.
Format Journal Article
LanguageEnglish
Published New York IEEE 01.06.2008
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Summary:The failure probability of a product F ( t ), and the life time quantile t p are commonly used metrics in reliability applications. Confidence intervals are used to quantify the s -uncertainty of estimators of these two metrics. In practice, a set of pointwise confidence intervals for F ( t ), or the quantiles t p are often plotted on one graph, which we refer to as pointwise ldquoconfidence bands.rdquo These confidence bands for F ( t ) or t p can be obtained through s -normal approximation, maximum likelihood, or other procedures. In this paper, we compare s -normal approximation to likelihood methods, and introduce a new procedure to get the confidence intervals for F ( t ) by inverting the pointwise confidence bands of the quantile t p function. We show why it is valid to interpret the set of pointwise confidence intervals for the quantile function as a set of pointwise confidence intervals for F ( t ), and vice-versa. Our results also indicate that the likelihood-based pointwise confidence bands have desirable statistical properties, beyond those that were known previously.
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content type line 23
ISSN:0018-9529
1558-1721
DOI:10.1109/TR.2008.920352