Comments on ultra-high-resolution STEM

The resolution of an image in a scanning transmission electron microscope may be improved if an image of the specimen is recorded for each point in the nanodiffraction pattern. It is shown that the method suggested by Rodenburg et al. (Ultramicroscopy 48 (1993) 304) may serve as the basis for an exp...

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Bibliographic Details
Published inUltramicroscopy Vol. 87; no. 1-2; pp. 1 - 4
Main Author Cowley, J.M.
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 01.03.2001
Elsevier Science
Subjects
Contrast transfer theory
Electron, positron and ion microscopes, electron diffractometers and related techniques
Exact sciences and technology
HRTEM
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
STEM
Contrast transfer theory
61.14.Lj
61.14.Dc
61.16.Bg Subject index terms: 001, 004, 008, 046
STEM
HRTEM
Theoretical study
Image resolution
Electron microscopy
Transfer functions
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Summary:The resolution of an image in a scanning transmission electron microscope may be improved if an image of the specimen is recorded for each point in the nanodiffraction pattern. It is shown that the method suggested by Rodenburg et al. (Ultramicroscopy 48 (1993) 304) may serve as the basis for an experimentally feasible scheme in which a resolution of better than 0.1nm is achieved for regions of 1nm diameter chosen from normal STEM images.
Bibliography:content type line 23
SourceType-Scholarly Journals-1
ObjectType-Correspondence-1
ISSN:0304-3991
1879-2723
DOI:10.1016/S0304-3991(00)00068-1